IMAGE ANALYSIS PLATFORM FOR IDENTIFYING ARTIFACTS IN SAMPLES AND LABORATORY CONSUMABLES

• US 20110255745A1
• Filed: 11/16/2009
• Published: 10/20/2011
• Est. Priority Date: 11/14/2008
• Status: Active Grant

• Current Assignee: The Scripps Research Institute
• Original Assignee: The Scripps Research Institute
• Inventors: Hodder, Peter, Scampavia, Louis Daniel, Baillargeon, Pierre Elliott
• Granted Patent: US 8,644,547 B2
• Time in Patent Office: Days
• US Class Current: 382/103
• CPC Class Codes: G01F 23/292 Light , e.g. infrared or ultraviolet
• CPC Class Codes: G01N 21/3577 for analysing liquids, e.g. polluted water
• CPC Class Codes: G01N 21/359 using near infrared light
• CPC Class Codes: G01N 21/55 Specular reflectivity
• CPC Class Codes: G01N 21/59 Transmissivity G01N21/25 takes precedence
• CPC Class Codes: G06T 7/0002 Inspection of images, e.g. flaw detection
• CPC Class Codes: G06V 20/698 Matching; Classification

Abstract

A High-resolution Image Acquisition and Processing Instrument (HIAPI) performs at least five simultaneous measurements in a noninvasive fashion, namely: (a) determining the volume of a liquid sample in welh (or microtubes) containing liquid sample, (b) detection of precipitate, objects of artifacts within microliter plate wells, (c) classification of colored samples in microliter plate wells or microtubes; (dl determination of contaminant (e.g. wafer concentration}; (e) air bubbles; (f) problems with the actual plate. Remediation of contaminant is also possible.

Claims

1. A system comprising:

a full-spectrum, ultraviolet, visible, infrared or near infra red light source for irradiating a consumable or consumable comprising a sample;

at least one lens in optical alignment with light reflected, transmitted through or emitted from the sample;

at least one sensor for detecting reflected light from the sample and/or light transmitted through the sample;

a computer or processor running software for processing and analyzing the reflected or transmitted light.

2. The system of claim 1, further comprising at least one filter in optical alignment with the light source and or/sensor for receiving light emitted from the light source.

3. The system of claim 2, wherein a filter comprising, at least one of:

AOTF, liquid crystal, polarized, attenuated, dichroic, emission, excitation, longpass, shortpass, bandpass, notch coated, dielectric, Bayer filter, or light diffuser.

4. The system of claim 1, wherein the light source, comprising:

blackbody radiator, IR, UV, visible, laser, monochromatic, polychromatic, LED, tungsten-halogen, quartz-tungsten halogen, Hg arc lamp, Xe arc lamp, electroluminescence or combinations thereof.

5. The system of claim 1, the at least one sensor is in optical alignment with at least one lens for focusing light reflected or emitted from or transmitted through the consumable or consumable comprising a sample.

6. The system of claim 1, wherein the at least one sensor comprising:

CCD, Photodiode, Photo multiplier tube, IR-NIR arrays, Focal Plane Array, InGaAs photodetector;

VisGaAs photodetector, InSb photodetector, Quantum Well Infrared photodetector or combinations thereof.

7. The system of claim 1, wherein the sensor is an image sensor and captures an image of the reflected, emitted or transmitted light from the sample, consumable or consumable comprising a sample.

8. The system of claim 7, wherein the captured images are standardized prior to analysis by the software.

9. The system of claim 7, wherein standardization of images by the software comprises at least one step of:

selecting an area of interest for analysis;

compensating for environmental artifacts;

comparing each pixel value to an assigned threshold value;

identifying and enhancing objects;

segmenting the image.

10. The system of claim 7, wherein the standardized image is analyzed and results stored.

11. The system of claim 1 further comprising a graphical user interface and one or more databases.

12. The system of claim 1, wherein said sensor comprising a charge-coupled device (CCD), focal plane array (FPA), near-infra red (NIR) sensor, NIR-VIS camera or combinations thereof.

13. A method of detecting and analyzing artifacts in a sample, consumable or consumable comprising a sample, said method comprising:

irradiating the sample with ultraviolet, visible, infra red or near infra red light;

capturing an image of light reflected from the sample or emitted or transmitted through the sample;

processing and analyzing the image; and

,

detecting and analyzing artifacts in a sample, consumable or consumable containing a sample.

14. The method of claim 13, wherein the software standardizes the image prior to analysis, said standardizing comprising at least one step of

selecting an area of interest for analysis;

compensation for environmental artifacts;

comparing each pixel value to an assigned threshold value;

identifying and enhancing objects;

segmenting the image.

15. The method of claim 13, wherein analyzing comprises measuring at least one of:

(a) volume of a liquid sample in wells or microtubes) containing liquid sample, (b) detecting precipitate, objects or artifacts within microtiter plate wells, (c) classifying colored samples in microtiter plate wells or microtubes;

(d) determining contaminants;

(e) an bubbles;

(g) problems with a consumable.

16. The method of claim 15, wherein DMSO and water are quantitatively assessed wherein A_x=A_water+A_DMSO=e_water*b*C_water+e_DMSO*b*C_DMSO and A_y=A_water+A_DMSO=e_water*b*C_water+e_DMSO*b*C_DMSO where concentrations [A=absorbance, e=molar absorptivity constant, b=path-length and c=concentration].

17. The method of claim 16, wherein x is >

0 and y is >

0.

18. The method of claim 15, wherein the system further comprises robotic integration, automation, semi automation or combinations thereof.

19. The method of claim 15, wherein remediation of a contaminant comprises contacting a sample with a composition which selectively removes the contaminant.