SURFACE MEASUREMENT INSTRUMENT AND METHOD

• US 20110258867A1
• Filed: 10/15/2009
• Published: 10/27/2011
• Est. Priority Date: 10/17/2008
• Status: Active Grant

• Current Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Original Assignee: Taylor Hobson Limited (Ametek Incorporated)
• Inventors: Mansfield, Daniel Ian, Scott, Paul James, McDonnell, Ivor
• Granted Patent: US 8,635,783 B2
• Time in Patent Office: Days
• US Class Current: 33/502
• CPC Class Codes: G01B 21/042 Calibration or calibration artifacts G01B3/30, G01B9/02072 take precedence
• CPC Class Codes: G01B 21/045 Correction of measurements G01B9/02055 takes precedence
• CPC Class Codes: G01B 5/008 using coordinate measuring machines

Abstract

A method of determining a correction parameter for use in effecting alignment of a component of a metrological apparatus in at least one direction is described which includes: positioning an artefact on a support surface of a turntable of the metrological apparatus so that a measurement surface of the artefact is asymmetric with respect to a rotation axis of the turntable in the at least one direction; using a measurement probe of the measurement instrument to make a first measurement of the measurement surface; rotating the turntable; using the measurement probe of the measurement instrument to make a second measurement of the measurement surface after rotation of the turntable; and determining a correction parameter from the first and second measurements.

Claims

1. A method of determining a correction parameter for use in effecting alignment of a component of a metrological apparatus in at least one direction, the method comprising:

positioning an artefact on a support surface of the metrological apparatus;

using a measurement probe of a measurement instrument to make a first measurement of the measurement surface;

effecting relative rotation of the measurement surface about a rotation axis such that a measurement surface of the artefact is asymmetric with respect to the rotation axis in the at lest one direction;

using the measurement probe of the measurement instrument to make a second measurement of the measurement surface after the rotation; and

determining a correction parameter from the first and second measurements.

2. A method according to claim 1, wherein the effecting relative rotation, rotates through 180 degrees between the first and second measurements.

3. A method according to claim 1 wherein the measurement probe is movable in a traverse direction to enable measurement of surface variation in a direction perpendicular to the traverse direction thereby defining a measurement plane.

5. A method according to claim 3, wherein an angle of the traverse direction is adjustable.

7. A method according to claim 3, wherein the traverse direction extends obliquely of the plane containing the support surface of the turntable.

8. A method according to claim 1, wherein the measurement surface of the artefact is at an oblique angle to a direction in which surface variations are measured by the measurement probe.

11. A method according to claim 1 wherein the measurement probe is movable in a traverse direction to enable measurement of surface variation in a direction perpendicular to the traverse direction thereby defining a measurement plane

and the artefact has a planar measurement surface extending at an oblique angle to the measurement plane.

12. A method according to claim 1, wherein the measurement surface of the artefact has an axis about which it is symmetrical and that axis is offset from the rotation axis of the turntable.

15. A method according to claim 1, further comprising correcting the alignment of the component based on the determined correction parameter.

16. A method according to claim 15, further comprising repeating the first and second measurements after correcting the alignment of the component on the basis of the determined correction parameter to enable refinement of the correction parameter.

57. A computer program product comprising program instructions to program processor means to carry out a method in accordance with claim 1.

4. (canceled)

6. (canceled)

9-10. -10. (canceled)

13-14. -14. (canceled)

17-19. -19. (canceled)

20. A method of determining an alignment correction parameter for centering a workpiece having first and second mirror image surface portions to a rotation axis of a turntable of a metrological apparatus, the method comprising:

measuring a form of the first surface portion at a first measurement position to provide first measurement data;

rotating the turntable to bring the second surface portion to the first measurement position;

measuring a form of the second surface portion at the first measurement position to provide second measurement data;

aligning the first and second measurement data using a feature of the form of the first and second surface portions; and

determining an alignment correction parameter based on results of the aligning.

21. A method according to claim 20, wherein the feature is a rotational discontinuity.

22. A method according to claim 20, wherein the feature is a rotational discontinuity defined by a rim of the workpiece.

23. A method according to claim 20, wherein the workpiece has mirror image third and fourth surface portions and the method further comprises:

measuring a form of the third surface portion of the workpiece at a measurement position to provide third measurement data;

rotating the turntable to bring the fourth surface portion of the workpiece to that measurement position;

measuring a form of the fourth surface portion at that measurement position to provide fourth measurement data;

aligning the third and fourth measurement data using a feature of the form of the third and fourth surface portions; and

determining another alignment correction parameter on the basis of the results of the aligning.

24-28. -28. (canceled)

29. Metrological apparatus comprising:

a turntable;

means for determining a correction parameter for use in effecting alignment of a component of the metrological apparatus in at least one direction;

an artefact mounted on a support surface of the turntable of the metrological apparatus so that a measurement surface of the artefact is asymmetric with respect to a rotation axis of the turntable in the at least one direction;

a measurement probe to make measurements on the measurement surface; and

means for rotating the turntable,

wherein the determining means is arranged to determine the correction parameter from a first measurement of the measurement surface by the measurement probe and a second measurement of the measurement surface by the measurement probe after rotation of the turntable.

30-47. -47. (canceled)

48. Metrological apparatus comprising:

a turntable to support a workpiece having first and second mirror image surface portions;

means for measuring surface form;

means for rotating the turntable about a rotation axis;

control means for causing;

the measuring means to measure a form of the first surface portion at a first measurement position to provide first measurement data, the rotating means to rotate the turntable to bring the second surface portion to the first measurement position, and the measuring means to measure a form of the second surface portion at the first measurement position to provide second measurement data;

means for aligning the first and second measurement data using a feature of the form of the first and second surface portions; and

means for determining an alignment correction parameter to centre the workpiece to the rotation axis based on results of the aligning.

49-56. -56. (canceled)

58-60. -60. (canceled)

61. Metrological apparatus comprising:

a rotatable turntable;

a processor for determining a correction parameter for use in effecting alignment of a component of the metrological apparatus in at least one direction;

an artefact mounted on a support surface of the turntable of the metrological apparatus so that a measurement surface of the artefact is asymmetric with respect to a rotation axis of the turntable in the at least one direction;

a measurement probe to make measurements on the measurement surface; and

wherein the processor is arranged to determine a correction parameter from a first measurement of the measurement surface by the measurement probe and a second measurement of the measurement surface by the measurement probe after rotation of the turntable.

62. Metrological apparatus comprising:

a rotatable turntable to support a workpiece having first and second mirror image surface portions, wherein the a rotatable turntable is rotatable about a rotation axis;

a measurement probe for measuring surface form;

a control mechanism for causing;

the measurement probe to measure the form of the first surface portion at a first measurement position to provide first measurement data;

the rotatable turntable to rotate to bring the second surface portion to the first measurement position; and

the measuring probe to measure the form of the second surface portion at the first measurement position to provide second measurement data;

the apparatus further comprising a processor configured to align the first and second measurement data using a feature of the form of the first and second surface portions and further configured to determine an alignment correction parameter to centre the workpiece to the rotation axis based on results of the aligning.

63. Apparatus according to claim 62, wherein the feature is a rotational discontinuity defined by a rim of the workpiece.

64. The metrological apparatus of claim 62 in which the turntable is fixed and the measurement probe is rotatable with.