METHOD OF TESTING SOLAR CELLS

• US 20110267090A1
• Filed: 11/18/2009
• Published: 11/03/2011
• Est. Priority Date: 11/19/2008
• Status: Active Grant

• Current Assignee: Technical University of Denmark
• Original Assignee: Technical University of Denmark
• Inventors: Krebs, Frederik Christian
• Granted Patent: US 8,766,660 B2
• Time in Patent Office: Days
• US Class Current: 324/761.01
• CPC Class Codes: G01J 1/08 Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
• CPC Class Codes: H02S 50/10 Testing of PV devices, e.g. of PV modules or single PV cells testing of semiconductor devices during manufacturing H01L22/00
• CPC Class Codes: Y02E 10/50 Photovoltaic [PV] energy

Abstract

A method of measuring the efficiency with which a solar cell converts incident photons into charge carriers, including the following steps: (a) illuminating the solar cell with a broadband light source; (b) illuminating the solar cell with the broadband light source of which the intensity of a selected range of wavelengths has been reduced; (c) determining the change in the number of photons incident on the cell and the change in the number of charge carriers produced by the cell between steps (a) and (b); and (d) using the changes determined in step (c) to calculate the said efficiency measure.

Claims

1. A method of measuring the efficiency with which a solar cell converts incident photons into charge carriers, comprising the following steps:

(a) illuminating the solar cell with a broadband light source;

(b) illuminating the solar cell with the broadband light source of which the intensity of a selected range of wavelengths has been reduced;

(c) determining the change in the number of photons incident on the cell and the change in the number of charge carriers produced by the cell between steps (a) and (b); and

(d) using the changes determined in step (c) to calculate the said efficiency measure.

2. A method according to claim 1 of measuring the incident photon to charge carrier efficiency (IPCE) of a solar cell, in which, in step (c), the change in the number of incident photons is determined as the change in intensity P in between steps (a) and (b), and the change in the number of charge carriers is determined as the change in short circuit current density JSC between steps (a) and (b), and in which, in step (d), the values of Pin and JSC are used to calculate a value of IPCE.

3. A method according to claim 2, in which step (c) is conducted by:

(i) measuring the intensity Pin,1 of the broadband light source in step (a) and the intensity Pin,2 of the broadband light source of which the intensity of a selected range of wavelengths has been reduced in step (b);

(ii) measuring the short circuit current density JSC,1 of the solar cell when illuminated by the broadband light source in step (a) and the short circuit current density JSC,2 of the solar cell when illuminated by the broadband light source of which the intensity of a selected range of wavelengths has been reduced in step (b);

(iii) comparing the values of Pin,1 with Pin,2 and JSC,1 with JSC,2 in order to arrive at the values of Pin and JSC due to the change in intensity of the selected wavelength range.

4. A method according to claim 2, in which the intensity of the selected range of wavelengths in step (b) is modulated using a selected waveform at a selected frequency, and step (c) is conducted by determining the modulated light intensity function Pin,m and the corresponding modulated short circuit current density function JSC,m.

5. A method according claim 1, wherein the broadband source comprises an array of light sources providing light of different wavelength ranges, and the intensity of the selected wavelength range is reduced by switching off the light sources providing light of the selected wavelength range.

6. A method according to claim 1, wherein the broadband source comprises an array of light sources providing light of different wavelength ranges, and the intensity of the selected wavelength range is reduced by reducing the intensity of the light sources providing light of the selected wavelength range.

7. A method according to claim 6, wherein the reduction in intensity of the selected wavelength range in step (d) is to 50% of the intensity of the selected wavelength range in step (a).

8. A method according to claim 6, wherein the reduction in intensity of the selected wavelength range in step (d) is to 75% of the intensity of the selected wavelength range in step (a).

9. A method according to claim 6, wherein the reduction in intensity of the selected wavelength range in step (d) is to 90% of the intensity of the selected wavelength range in step (a).

10. A method according to claim 6, wherein the reduction in intensity of the selected wavelength range in step (d) is to 95% of the intensity of the selected wavelength range in step (a).

11. A method according to claim 1, wherein the selected wavelength range has a maximum FWHM range of 50 nm.

12. A method according to claim 1, wherein the selected wavelength range excluded from the broadband source has a maximum FWHM range of 40 nm.

13. A method according to claim 1, comprising a further step before step (a) in which the broadband source is adjusted to simulate the spectrum of a chosen light source, preferably the sun.