Symmetrical Electrical Physical Layer Activity Detector

• US 20110267110A1
• Filed: 07/14/2011
• Published: 11/03/2011
• Est. Priority Date: 03/18/2008
• Status: Active Grant

• Current Assignee: Microchip Technology Incorporated
• Original Assignee: Microchip Technology Incorporated
• Inventors: McLeod, Scott C.
• Granted Patent: US 8,138,802 B2
• Time in Patent Office: Days
• US Class Current: 327/58
• CPC Class Codes: H03F 3/3076 with symmetrical driving of the end stage
• CPC Class Codes: H03F 3/45 Differential amplifiers differential sense amplifiers G11C7/062

Abstract

A low-current differential signal activity detector circuit may be configured to reject large common mode signals on differential input lines, while still detecting smaller differential signals applied to the same set of differential input lines. The detector circuit may comprise a translinear buffer that is driven at the buffer input and at the buffer output by the differential input signals. The differential signal thereby driving the inputs of the detector circuit may be half-wave rectified through the buffer output devices and may be filtered to provide the detected output. When applying a common mode signal, the buffer'"'"'s input and output may track each other, and no current may be rectified in the output devices, thus providing common-mode signal rejection. The detector circuit may also be configured with two buffers having their outputs coupled to a common node, each buffer input driven by a respective one of the differential input signals. The differential signal thereby driving the inputs of the detector circuit may be fully rectified through the output devices of the two buffers, and may be filtered to provide the detected output. The two buffers may be configured in a symmetrical structure that allows for the rejection of common-mode signals when the outputs of the buffers are coupled to a common node.

Claims

1. A detection circuit comprising:

a differential input comprising a first input and a second input;

an output configured to provide a first output signal of the detection circuit, wherein the first output signal is indicative of differential signal activity on the differential input;

a first buffer having an input coupled to the first input of the detection circuit, and comprising an output stage configured to provide an output of the first buffer; and

a second buffer having an input coupled to the second input of the detection circuit, and comprising an output stage configured to provide an output of the second buffer; and

a load circuit;

wherein the output of the first buffer and the output of the second buffer are coupled to a first node;

wherein the output stage of the first buffer and the output stage of the second buffer are configured to fully rectify a differential input signal present at the differential input, to generate a fully rectified first signal; and

wherein the load circuit is configured to filter the fully rectified first signal to generate the first output signal of the detector.

2. The detection circuit of claim 1, wherein the first buffer and the second buffer each comprise a respective input stage, wherein the input stage of the first buffer comprises a first pair of transistors, each of the first pair of transistors having a respective first channel terminal coupled to a second node configured as the input of the first buffer, and wherein the input stage of the second buffer comprises a second pair of transistors, each of the second pair of transistors having a respective first channel terminal coupled to a third node configured as the input of the second buffer;

and

wherein the output stage of the first buffer comprises a third pair of transistors, each of the third pair of transistors having a respective first channel terminal coupled to the first node, and wherein the output stage of the second buffer comprises a fourth pair of transistors, each of the fourth pair of transistors having a respective first channel terminal coupled to the first node.

3. The detection circuit of claim 2, wherein the second node and the third node are each coupled to a reference voltage.

4. The detection circuit of claim 2, further comprising one of:

a load circuit coupled between a fourth node and a reference voltage that is lower than a supply voltage powering the detection circuit, wherein the fourth node is coupled to respective second channel terminals of a first one of the third pair of transistors and a first one of the fourth pair of transistors, wherein the fourth node is configured as the first output of the detection circuit;

or

a load circuit coupled between a fifth node and the supply voltage powering the detection circuit, wherein the fifth node is coupled to respective second channel terminals of a second one of the third pair of transistors and a second one of the fourth pair of transistors, wherein the fifth node is configured as the first output of the detection circuit.

5. The detection circuit of claim 1, further comprising:

a calibration circuit configured to store a quiescent voltage developed at the first output of the detection circuit when no input signal is driving the first input of the detection circuit and the second input of the detection circuit;

wherein the calibration circuit is further configured to subtract the quiescent voltage from the first output signal to generate a second output signal of the detector circuit when the differential input signal is present at the differential input.

6. The detection circuit of claim 5, wherein the calibration circuit is configured to further subtract a specified threshold voltage from the first output signal to generate the second output signal of the detector circuit when the differential input signal is present at the differential input.