SYSTEM AND METHOD FOR IMPROVED TESTING OF ELECTRONIC DEVICES

• US 20110273184A1
• Filed: 05/04/2010
• Published: 11/10/2011
• Est. Priority Date: 05/04/2010
• Status: Active Grant

• Current Assignee: Electro Scientific Industries Incorporated (MKS Instruments Incorporated)
• Original Assignee: Electro Scientific Industries Incorporated (MKS Instruments Incorporated)
• Inventors: Cooke, Vernon
• Granted Patent: US 8,598,888 B2
• Time in Patent Office: Days
• US Class Current: 324/537
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67

Abstract

An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.

Claims

1. An improved method of testing and sorting electronic devices using an automated test system, said automated test system having a track for transporting said electronic devices, the improvements comprising:

providing said automated test system with a first test station, a second test station, a first sort station and a second sort station, all adjacent to said track;

transporting a first portion of said electronic devices to a position adjacent to said first test station with said track, and transporting a second portion of said electronic devices to a position adjacent to said second test station with said track, said transporting of said first and second portions of said electronic devices occurring substantially simultaneously,

performing first testing on said first portion of said electronic devices with said first test station to obtain first test results and performing second testing on said second portion of said electronic devices with said second test station to obtain second test results, said first and second testing occurring substantially simultaneously;

transporting said first tested portion of said electronic devices adjacent to said first sort station and transporting said second tested portion of said electronic devices adjacent to said second sort station; and

sorting said first tested portion of said electronic devices with said first sorting station according to said first test results and sorting said second tested portion of said electronic devices according to said second test results, said sorting occurring substantially simultaneously, thereby testing and sorting said electronic devices with said first and second test stations on one said track.

2. The method of claim 1 wherein said electronic device is a passive electronic component.

3. The method of claim 1 wherein said electronic device is a light emitting diode.

4. The method of claim 1 wherein said track is rotary.

5. The method of claim 1 wherein said track is linear.

6. The method of claim 1 wherein said automated test system has more than one track.

7. An improved automated test system for testing electronic devices, said improvements comprising:

a track operative to transport said electronic devices by indexing;

first and second test stations arranged adjacent to said track;

first and second sort stations arranged adjacent to said track; and

wherein said track is operative to transport electronic devices so that one portion of said electronic devices is adjacent to said first test station while a second portion of said electronic devices is adjacent to said second test station.

8. The system of claim 7 wherein said electronic device is a passive electronic component.

9. The system of claim 7 wherein said electronic device is a light emitting diode.

10. The system of claim 7 wherein said track is rotary.

11. The system of claim 7 wherein said track is linear.

12. The system of claim 7 wherein said improvements comprise more than one track and first and second test stations adjacent to each track and first and second sort stations arranged adjacent to each track.