SYSTEM AND METHOD FOR IMPROVED TESTING OF ELECTRONIC DEVICES
First Claim
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1. An improved method of testing and sorting electronic devices using an automated test system, said automated test system having a track for transporting said electronic devices, the improvements comprising:
- providing said automated test system with a first test station, a second test station, a first sort station and a second sort station, all adjacent to said track;
transporting a first portion of said electronic devices to a position adjacent to said first test station with said track, and transporting a second portion of said electronic devices to a position adjacent to said second test station with said track, said transporting of said first and second portions of said electronic devices occurring substantially simultaneously,performing first testing on said first portion of said electronic devices with said first test station to obtain first test results and performing second testing on said second portion of said electronic devices with said second test station to obtain second test results, said first and second testing occurring substantially simultaneously;
transporting said first tested portion of said electronic devices adjacent to said first sort station and transporting said second tested portion of said electronic devices adjacent to said second sort station; and
sorting said first tested portion of said electronic devices with said first sorting station according to said first test results and sorting said second tested portion of said electronic devices according to said second test results, said sorting occurring substantially simultaneously, thereby testing and sorting said electronic devices with said first and second test stations on one said track.
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Abstract
An improved method of testing and sorting electronic devices uses two or more test stations and two or more sorting stations applied to a single track to improve system throughput. Applying two or more test stations and two or more sorting stations to a single track accomplishes improved system throughput while increasing system cost less than would be expected if a duplicate track was installed for each test station.
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Citations
12 Claims
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1. An improved method of testing and sorting electronic devices using an automated test system, said automated test system having a track for transporting said electronic devices, the improvements comprising:
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providing said automated test system with a first test station, a second test station, a first sort station and a second sort station, all adjacent to said track; transporting a first portion of said electronic devices to a position adjacent to said first test station with said track, and transporting a second portion of said electronic devices to a position adjacent to said second test station with said track, said transporting of said first and second portions of said electronic devices occurring substantially simultaneously, performing first testing on said first portion of said electronic devices with said first test station to obtain first test results and performing second testing on said second portion of said electronic devices with said second test station to obtain second test results, said first and second testing occurring substantially simultaneously; transporting said first tested portion of said electronic devices adjacent to said first sort station and transporting said second tested portion of said electronic devices adjacent to said second sort station; and sorting said first tested portion of said electronic devices with said first sorting station according to said first test results and sorting said second tested portion of said electronic devices according to said second test results, said sorting occurring substantially simultaneously, thereby testing and sorting said electronic devices with said first and second test stations on one said track. - View Dependent Claims (2, 3, 4, 5, 6)
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7. An improved automated test system for testing electronic devices, said improvements comprising:
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a track operative to transport said electronic devices by indexing; first and second test stations arranged adjacent to said track; first and second sort stations arranged adjacent to said track; and wherein said track is operative to transport electronic devices so that one portion of said electronic devices is adjacent to said first test station while a second portion of said electronic devices is adjacent to said second test station. - View Dependent Claims (8, 9, 10, 11, 12)
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Specification