SIGNAL GENERATOR FOR A BUILT-IN SELF TEST
First Claim
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1. An integrated circuit with Built-in Self Test (BiST), comprising:
- a signal generator on the integrated circuit, wherein the signal generator is used to perform a BiST on the integrated circuit; and
a local oscillator on the integrated circuit used by the signal generator to generate one or more test signals used to perform the BiST on the integrated circuit.
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Abstract
An integrated circuit with Built-in Self Test (BiST) is described. The integrated circuit includes a signal generator used to perform a BiST on the integrated circuit. The integrated circuit also includes a local oscillator used by the signal generator to generate one or more test signals used to perform the BiST on the integrated circuit.
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Citations
49 Claims
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1. An integrated circuit with Built-in Self Test (BiST), comprising:
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a signal generator on the integrated circuit, wherein the signal generator is used to perform a BiST on the integrated circuit; and a local oscillator on the integrated circuit used by the signal generator to generate one or more test signals used to perform the BiST on the integrated circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25)
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26. A method for generating signals for a Built-in Self Test (BiST), comprising:
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generating, on an integrated circuit, a local oscillator signal; receiving an external signal; and mixing, on the integrated circuit, two or more signals to generate one or more test signals for a BiST. - View Dependent Claims (27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44)
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45. A computer-program product for generating signals for a Built-in Self Test (BiST), the computer-program product comprising a non-transitory computer-readable medium having instructions thereon, the instructions comprising:
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code for generating a local oscillator signal; code for receiving an external signal; and code for mixing two or more signals to generate one or more test signals. - View Dependent Claims (46, 47)
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48. An apparatus for generating signals for a Built-in Self Test (BiST), comprising:
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means for generating a local oscillator signal; means for receiving an external signal; and means for mixing two or more signals to generate one or more test signals. - View Dependent Claims (49)
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Specification