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Data processing apparatus and method for testing a circuit block using scan chains

  • US 20110276848A1
  • Filed: 05/06/2010
  • Published: 11/10/2011
  • Est. Priority Date: 05/06/2010
  • Status: Active Grant
First Claim
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1. A data processing apparatus comprising:

  • a circuit block to be tested;

    a plurality of scan chains, each scan chain in said plurality providing a mechanism for providing input test data to, and receiving output test data from, at least a portion of the circuit block during a test mode of operation;

    an input interface for receiving compressed input test data;

    configurable decompression circuitry for supporting a plurality of decompression schemes associated with more than one test generation tool, the configurable decompression circuitry being connected between the input interface and the plurality of scan chains; and

    configuration circuitry, responsive to a configuration stimulus, to configure the configurable decompression circuitry to implement a selected decompression scheme from said plurality, such that on receipt of the compressed input test data from the input interface the configurable decompression circuitry applies the selected decompression scheme to the compressed input test data to produce the input test data to be provided to said plurality of scan chains.

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