METHOD FOR DETERMINING A TWIST STRUCTURE

• US 20110283784A1
• Filed: 04/28/2011
• Published: 11/24/2011
• Est. Priority Date: 04/29/2010
• Status: Active Grant

• Current Assignee: Hommel-Etamic GmbH (Jenoptik AG)
• Original Assignee: Hommel-Etamic GmbH (Jenoptik AG)
• Inventors: Seewig, Jörg
• Granted Patent: US 8,973,280 B2
• Time in Patent Office: Days
• US Class Current: 73/105
• CPC Class Codes: G01B 21/30 for measuring roughness or irregularity of surfaces
• CPC Class Codes: G01B 5/28 for measuring roughness or irregularity of surfaces

Abstract

Method for determining a twist structure in the surface roughness of a workpiece which is cylindrical at least in part includes that multiple sampling segments which extend in the axial direction of the workpiece and which are mutually spaced apart in the circumferential direction are carried out in a surface region of interest on the workpiece, and the value of at least one parameter of the twist structure is determined based on the measured values obtained using the sampling segments. An estimated value of at least one parameter of the twist structure is determined based on the measured values associated with a first sampling segment, the estimated value being corrected based on the measured values associated with at least one second sampling segment.

Claims

1. Method for determining a twist structure in the surface roughness of a workpiece which is cylindrical at least in part, comprising:

a) multiple sampling segments which extend in the axial direction of the workpiece and which are mutually spaced apart in the circumferential direction are carried out in a surface region of interest on the workpiece;

b) the value of at least one parameter of the twist structure is determined based on the measured values obtained using the sampling segments;

c) an estimated value of at least one parameter of the twist structure is determined based on the measured values associated with a first sampling segment; and

d) the estimated value is corrected based on the measured values associated with at least one second sampling segment.

2. Method according to claim 1, wherein:

a) at least one estimated value is corrected after each newly recorded sampling segment.

3. Method according to claim 2, wherein:

a) for determining an end result of at least one parameter, the correction of the at least one estimated value is repeated until the measured values of each of the multiple sampling segments have been taken into account.

4. Method according to claim 3, wherein:

a) estimated values of the twist depth and the period length are determined based on the measured values associated with the first sampling segment.

5. Method according to claim 4, wherein:

a) an estimated value of the thread number of the twist structure is determined after carrying out the at least one second sampling segment.

6. Method according to claim 1, wherein:

a) for determining an end result of at least one parameter, the correction of the at least one estimated value is repeated until the measured values of each of the multiple sampling segments have been taken into account.

7. Method according to claim 6, wherein:

a) estimated values of the twist depth and the period length are determined based on the measured values associated with the first sampling segment.

8. Method according to claim 7, wherein:

a) an estimated value of the thread number of the twist structure is determined after carrying out the at least one second sampling segment.

9. Method according to claim 1, wherein:

a) estimated values of the twist depth and the period length are determined based on the measured values associated with the first sampling segment.

10. Method according to claim 9, wherein:

a) an estimated value of the thread number of the twist structure is determined after carrying out the at least one second sampling segment.

11. Method according to claim 1, wherein:

a) an estimated value of the thread number of the twist structure is determined after carrying out the at least one second sampling segment.