Semiconductor Device Structures and Related Processes
First Claim
Patent Images
1. A semiconductor device structure, comprising:
- a gate which is positioned in a first trench, and capacitively coupled to control vertical conduction from a first-conductivity-type source through semiconductor material which is adjacent to said trench;
recessed field plates, positioned in proximity to and capacitively coupled to said semiconductor material;
said recessed field plates being positioned in respective second trenches; and
diffusions of a second conductivity type lying at least partially beneath said respective second trenches.
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Abstract
Improved highly reliable power RFP structures and fabrication and operation processes. The structure includes plurality of localized dopant concentrated zones beneath the trenches of RFPs, either floating or extending and merging with the body layer of the MOSFET or connecting with the source layer through a region of vertical doped region. This local dopant zone decreases the minority carrier injection efficiency of the body diode of the device and alters the electric field distribution during the body diode reverse recovery.
7 Citations
33 Claims
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1. A semiconductor device structure, comprising:
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a gate which is positioned in a first trench, and capacitively coupled to control vertical conduction from a first-conductivity-type source through semiconductor material which is adjacent to said trench; recessed field plates, positioned in proximity to and capacitively coupled to said semiconductor material;
said recessed field plates being positioned in respective second trenches; anddiffusions of a second conductivity type lying at least partially beneath said respective second trenches. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A semiconductor device structure, comprising:
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a semiconductor layer; a gate which is positioned in a first trench within said semiconductor layer, and is capacitively coupled to control vertical conduction from a first-conductivity-type source through second-conductivity-type portions of said layer near said trench; recessed field plates, positioned in proximity to and capacitively coupled to said semiconductor material;
said recessed field plates being positioned in respective second trenches;diffusion components of a second conductivity type lying at least partially beneath said respective second trenches; whereby said diffusion components reduce depletion of said second-conductivity-type portions of said layer in the OFF state. - View Dependent Claims (11, 12, 13, 14, 15)
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16. A semiconductor device structure, comprising:
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a semiconductor layer; a gate which is positioned in a first trench within said semiconductor layer, and is capacitively coupled to control vertical conduction from a first-conductivity-type source through second-conductivity-type portions of said layer near said trench; recessed field plates, positioned in proximity to and capacitively coupled to said semiconductor material;
said recessed field plates being positioned in respective second trenches;a first additional diffusion component of a second conductivity type lying at least partially beneath said respective second trenches; and a second additional diffusion component of said first conductivity type lying at least partially within said second-conductivity-type portions of said layer; whereby said first additional diffusion component reduces depletion of said second-conductivity-type portions of said layer in the OFF state; and whereby said second additional diffusion component reduces the on-resistance of the device in the ON state. - View Dependent Claims (17, 18, 19, 20, 21, 23, 24, 25)
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22. An improved RFP transistor structure having (a) low total on-resistance, (b) reduced minority carrier injection efficiency (of body diode), (c) improved reverse recovery (of body diode), (c) lower reverse recovery charge, (d) soft recovery characteristic, (e) as reliable edge termination, without either reduction of breakdown voltage or degradation of the termination efficiency of device edge junction termination region, the improved structure comprising:
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an RFP transistor structure, including at least one or more gate trenches adjoined by one or more recessed-field-plate trenches; and respective deep compensated zones underneath said recessed-field-plate trenches.
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26. A method for operating a semiconductor device structure, comprising:
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controlling conduction between first and second source/drain electrodes through a channel location in semiconductor material using a gate electrode positioned in a first trench to provide at least ON and OFF states; and avoiding punchthrough of said channel location, using both one or more recessed field plates, positioned in proximity to and capacitively coupled to said semiconductor material;
said recessed field plates being positioned in respective second trenches, andone or more diffusion components of a second conductivity type lying at least partially beneath said respective second trenches; whereby said diffusion components reduce depletion spreading in the OFF state. - View Dependent Claims (27, 28, 29, 30, 31, 32)
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33. A fabrication process for making a MOSFET, comprising the actions, in any order, of:
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a) providing an n-type semiconductor layer; b) forming a p-type body in said layer; c) forming an n-type source, which is isolated by said body, in said layer; d) forming an insulated gate trench in said layer, and a gate electrode in said gate trench;
said gate electrode being capacitively coupled to at least a portion of said body;e) forming a second insulated trench in said layer, providing an additional dose of acceptor dopants below said trench, and forming a Recessed Field Plate electrode in said second trench; and f) providing an additional dose of donor dopant atoms in said portion of said body, to thereby reduce the on-resistance.
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Specification