Apparatus And Method For Producing Plasma

• US 20110298376A1
• Filed: 01/12/2010
• Published: 12/08/2011
• Est. Priority Date: 01/13/2009
• Status: Abandoned Application

• Current Assignee: River Bell Company
• Original Assignee: River Bell Company
• Inventors: Kanegae, Masatomo, Kato, Kyoichi, Onoe, Kaoru, Fukuoka, Daisuke
• Application Number:
  US13/143,311
• Publication Number:
  US 20110298376A1
• Time in Patent Office: Days
• US Class Current: 315/111.51
• CPC Class Codes: B01J 19/088 giving rise to electric discharges for heating purposes H05B7/00; for the production of ozone C01B13/11, H01T19/00
• CPC Class Codes: B01J 2219/0809 employing two or more electrodes
• CPC Class Codes: B01J 2219/083 cylindrical
• CPC Class Codes: B01J 2219/0871 Heating or cooling of the reactor
• CPC Class Codes: B01J 2219/0884 Gas-liquid
• CPC Class Codes: B01J 2219/0898 Hot plasma
• CPC Class Codes: H01J 37/32 Gas-filled discharge tubes heating by discharge H05B
• CPC Class Codes: H05H 1/246 the plasma being activated using external electrodes H05H1/245 takes precedence
• CPC Class Codes: H05H 1/2465 the plasma being activated by inductive coupling, e.g. using coiled electrodes
• CPC Class Codes: H05H 1/4622 using waveguides
• CPC Class Codes: H05H 2240/10 at atmospheric pressure
• CPC Class Codes: H05H 2240/20 Non-thermal plasma

Abstract

The plasma generation device comp rising first plasma generation chamber 10 which has gas feed opening 12 and plasma exit 13, and first plasma generation means 11 which is arranged in space of said first plasma generation chamber in state of not exposed, and second plasma generation chamber 20 which has plasma feed opening 22 whereby plasma generated said first plasma generation chamber through said plasma exit, and second plasma generation means 21 which is arranged in space of said second plasma generation chamber in state of not exposed wherever generating higher density than plasma generated by said first plasma generation chamber.

Claims

1. A plasma generation device comprising a first plasma generation chamber which has a gas feed opening and a plasma exit, and a first plasma generation means arranged in a state without exposure to the space within said first plasma generation chamber, and a second plasma generation chamber which has a plasma feed opening and wherein plasma generated at said first plasma generation chamber is supplied through said plasma exit and said plasma feed opening and wherein a second plasma generation means which is arranged in a state without exposure to the space within said second plasma generation chamber.

2. The plasma generation device of claim 1 wherein said first plasma generation means comprises a pair of electrodes, and established insulating means which prevents electric discharge between said pair of electrodes outside said first plasma generation chamber.

3. The plasma generation device of claim 2 wherein the distance between said pair of electrodes is 2 mm-10 mm.

4. The plasma generation means of claim 1 wherein said first plasma generation means generates plasma by impressing high voltage AC to a single electrode.

5. The plasma generation device of claim 1 wherein bias electrode is arranged at lower stream side of said second plasma generation chamber.

6. The plasma generation device of claim 1 wherein said first plasma generation chamber is arranged at lower stream side of said second plasma generation chamber.

7. The plasma generation device of claim 1 wherein the distance from said first plasma generation means to said second plasma generation means is longer than the length of prolonged plasma which is generated at said second plasma generation chamber from said second plasma generation means.

8. The plasma generation device of claim 1 wherein said first plasma generation chamber is established as part of piping and said second plasma generation chamber is a plasma torch connected with said piping.

9. The plasma generation device of claim 8 wherein the distance from said second plasma generation means to the tip of said plasma torch is 5 mm-15 mm.

10. The plasma generation device of claim 1 wherein said first plasma generating chamber is established as part of a continuous straight piping, and said second plasma generation chamber is established as the other part.

11. The plasma generation device of claim 10 wherein the distance from said second plasma generation means to the tip of said piping is 5 mm-15 mm.

12. The plasma generation device of claim 1 wherein said second plasma generation means comprises coil and generates inductively coupled plasma in said second plasma generation chamber.

13. The plasma generation device of claim 1 wherein plasma is generated in said first plasma generation chamber by said first plasma generation means under state of normal pressure, higher than normal pressure or rough vacuum of 1.333×

10⁴ Pa-1.013×

10⁵ Pa, then plasma is generated in said second plasma generation chamber using said second plasma generation means and plasma generated in said first plasma generation chamber.

14. The plasma generation device of claim 1 wherein said second plasma generation chamber comprises a gas feed port which enables the introduction of gas without intervention of said first plasma generation chamber.

15. The plasma generation device of claim 1 wherein a liquid phase is established at the lower stream side of said second plasma generation chamber.

16. Plasma generation means wherein a first plasma is generated in a first plasma generating chamber by supplying a first plasma gas and by supplying electric power from a first plasma generation means which is located in said first plasma generation chamber without exposing, and a second plasma is generated in a second plasma generating chamber by supplying a second plasma gas and by supplying electric power from a second plasma generation means which is located in said second plasma generation chamber without exposing, additionally by supplying first plasma generated in said first plasma generation chamber.

17. The plasma generation means of claim 16 wherein said second plasma has a higher density than said first plasma.

18. The plasma generation means of claim 16 wherein said second plasma does not generate plasma until said first plasma is supplied.

19. The plasma generation means of claim 16 wherein the supply of said first plasma gas or power supply of said first plasma generation means is stopped after starting plasma generation in said second plasma generation chamber.

20. The plasma generation means of claim 16 wherein said second plasma generation means supplies electric power to said second plasma generation chamber before said first plasma generation means supplies electric power to said first plasma generation chamber, then said first plasma generated at said first plasma generation chamber by supplying electric power by said first plasma generation means is supplied to said second plasma generation chamber.

21. The plasma generation means of claim 16 wherein said first plasma is supplied to said second plasma generation chamber from the lower stream side.

22. The plasma generation means of claim 16 wherein said first plasma or said second plasma is expanded toward the lower stream side by a bias electrode prepared in the lower side of said second plasma generation chamber.

23. The plasma generation means of claim 16 wherein said first plasma gas is a rare gas such as helium gas, argon gas, xenon gas, or neon gas, and said second plasma gas is one sort of or plurality of rare gas such as helium gas, argon gas, xenon gas or neon gas, a halogenated carbon, a semiconductor gas, pure air, dry air, oxygen, nitrogen, hydrogen, steam, halogen, ozone or SF₆.

24. The plasma generation means of claim 16 wherein part of said first plasma gas is used as said second plasma gas.

25. The plasma generation means of claim 16 wherein said second plasma gas is introduces into said second plasma generation chamber without intervention of said first plasma generation chamber.

26. The plasma generation means of claim 16 wherein said second plasma generation means comprises coil and generates inductively coupled plasma of said second plasma gas.

27. The plasma generation means of claim 16 wherein said first plasma and said second plasma is generated under state of normal pressure, higher than normal pressure or rough vacuum of 1.333×

10⁴ Pa-1.013×

10⁵ Pa.

28. The plasma generation means of claim 16 wherein said second plasma is emitted into a liquid phase.

29. The plasma generation means of claim 23 wherein said halogenated carbon is a chlorofluorocarbon, a hydrofluorocarbon, or a perfluorocarbon.

30. The plasma generation means of claim 29 wherein said halogenated carbon is CF₄ or C₂F₆.

31. The plasma generation means of claim 23 wherein said semiconductor gas is SiH₄, B₂H₆ or PH₃.