×

Method and apparatus for analysis and assessment of measurement data of a measurement system

  • US 20110307217A1
  • Filed: 08/22/2011
  • Published: 12/15/2011
  • Est. Priority Date: 01/14/2008
  • Status: Abandoned Application
First Claim
Patent Images

1. A method for analysis and assessment of measurement data of a measurement system having at least one measurement channel, comprising the assessment of the measurement data at freely selectable times and over a freely selectable period on the basis of at least one of a plurality of predeterminable criteria, wherein the raw data of the measurement channel is supplied to a fault isolation stage and then to a fault classification stage, and in that a measure is then determined for the quality of the measurement data of the respective measurement channel.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×