METHOD AND APPARATUS FOR PRECURSOR DELIVERY

• US 20110311726A1
• Filed: 06/17/2011
• Published: 12/22/2011
• Est. Priority Date: 06/18/2010
• Status: Abandoned Application

• Current Assignee: Ultratech Incorporated (Veeco Instruments Incorporated)
• Original Assignee: Cambridge NanoTech Incorporated (Veeco Instruments Incorporated)
• Inventors: Liu, Guo, Bertuch, Adam, Deguns, Eric W., Dalberth, Mark J., Sundaram, Ganesh M., Becker, Jill Svenja
• Application Number:
  US13/162,850
• Publication Number:
  US 20110311726A1
• Time in Patent Office: Days
• US Class Current: 427/255.26
• CPC Class Codes: C23C 16/4481 by evaporation using carrier gas in contact with the source material C23C16/4486 takes precedence
• CPC Class Codes: C23C 16/45544 characterized by the apparatus
• CPC Class Codes: C23C 16/52 Controlling or regulating the coating process C23C16/45557, C23C16/279 take precedence

Abstract

An improved precursor vaporization device and method for vaporizing liquid and solid precursors having a low vapor pressure at a desired precursor temperature includes elements and operating methods for injecting an inert gas boost pulse into a precursor container prior to releasing a precursor pulse to a reaction chamber. An improved ALD system and method for growing thin films having more thickness and thickness uniformity at lower precursor temperatures includes devices and operating methods for injecting an inert gas boost pulse into a precursor container prior to releasing a precursor pulse to a reaction chamber and for releasing a plurality of first precursor pulses into a reaction chamber to react with substrates before releasing a different second precursor pulse into the reaction chamber to react with the substrates.

Claims

1. A gas deposition system comprising:

a first precursor container partially filled with a non-vaporized precursor and including a vapor space;

an inlet conduit extending between an inert gas supply and the vapor space;

an outlet conduit extending between the vapor space and a reaction chamber;

a first pulse valve disposed along the outlet conduit between the vapor space and a reaction chamber;

a second pulse valve disposed along the inlet conduit between the inert gas supply and the vapor space;

a gas flow restrictor disposed along the inlet conduit between the inert gas supply and the second pulse valve.

2. The gas deposition system of claim 1 further comprising a controller in communication with each of the first and second pulse valves for independently pulsing each of the first and second pulse valves.

3. The gas deposition system of claim 1 wherein the first precursor container includes an outer wall having a single port passing there though to the vapor space and wherein each of the inlet and outlet conduits is in fluid communication with the vapor space through the single port.

4. The gas deposition system of claim 1 further comprising a gas pressure sensor in communication with the controller and positioned to monitor gas pressure in the vapor space.

5. The gas deposition system of claim 2 further comprising a heater disposed to heat the non-vaporized precursor inside the first precursor container and a temperature sensor in communication with the controller and positioned to monitor a temperature of the non-vaporized precursor.

6. The gas deposition system of claim 1 wherein the gas flow restrictor comprises an orifice.

7. The gas deposition system of claim 6 wherein the inert gas supply has an inlet pressure ranging from 20-40 psi and the orifice has a circular diameter in the range of 100-150 microns.

8. The gas deposition system of claim 2 wherein the gas flow restrictor comprises:

a third pulse valve disposed along the inlet conduit between the inert gas supply and the second pulse valve;

an inert gas storage volume disposed between the second and third pulse valves; and

,

wherein the controller is in communication with the third pulse valve for independently pulsing the third pulse valve.

9. The gas deposition system of claim 8 further comprising a gas pressure sensor in communication with the controller and positioned to monitor gas pressure in the inert gas storage volume.

10. The gas deposition system of claim 8 wherein the inert gas storage volume comprises a variable volume.

11. The gas deposition system of claim 2 wherein each of the first and second pulse valves is operable with pulse durations in the range of 5 msec to 1 second.

12. The gas deposition system of claim 8 wherein each of the first, second, and third pulse valves is operable with pulse durations in the range of 5 msec to 1 second.

13. The gas deposition system of claim 11 wherein the controller is configured to independently operate each of the first and second pulse valves at any pulse duration in the pulse duration range.

14. The gas deposition system of claim 12 wherein the controller is configured to independently operate each of the first, second, and third pulse valves at any pulse duration in the pulse duration range.

15. The gas deposition system of claim 2 wherein the controller is configured to independently vary the pulse frequency of each of the first and second pulse valves.

16. The gas deposition system of claim 8 wherein the controller is configured to independently vary the pulse frequency of each of the first, second, and third pulse valves.

17. The gas deposition system of claim 2 wherein each pulse of the first pulse valve injects an inert gas pulse into the vapor space and the volume of the inert gas pulse ranges from 0.1 to 4.0 ml.

18. The gas deposition system of claim 2 wherein each pulse of the first pulse valve injects an inert gas pulse into the vapor space and the volume or the inert gas pulse ranges from 0.4% to 16% of a volume or the vapor space.

19. The gas deposition system of claim 2 wherein each pulse of the first pulse valve injects an inert gas pulse into the vapor space and the volume or the inert gas pulse ranges from 0.1% to 200% of a volume or the vapor space.

20. A gas deposition method comprising:

partially filling a first precursor container with a non-vaporized precursor and providing a vapor space in the first precursor container;

closing a first pulse valve disposed along an outlet conduit between the vapor space and a reaction chamber;

injecting an inert gas pulse into the vapor space with the first pulse valve closed;

closing a second pulse valve disposed along the inlet conduit between the inert gas supply and the vapor space;

releasing a precursor pulse from the vapor space to the reaction chamber with the second pulse valve closed.

21. The gas deposition method of claim 20 further comprising restricting gas flow between the inert gas supply and the second pulse valve with an orifice.

22. The gas deposition method of claim 21 further comprising heating the non-vaporized precursor to a temperature that is below a thermal breakdown temperature of the non-vaporized precursor.

23. The gas deposition method of claim 22 further comprising repeating steps of;

closing the first pulse valve;

injecting an inert gas pulse into the vapor space with the first pulse valve closed;

closing the second pulse valve;

releasing a precursor pulse from the vapor space to the reaction chamber with the second pulse valve closed.

24. A gas deposition method comprising:

partially filling a first precursor container with a non-vaporized precursor and providing a vapor space in the first precursor container;

closing a first pulse valve disposed along an outlet conduit between the vapor space and a reaction chamber;

closing a second pulse valve disposed along the inlet conduit between the inert gas supply and the vapor space;

closing a third pulse valve disposed along the inlet conduit between the inert gas supply and the second pulse valve;

pulsing the third pulse valve to fill an inert gas storage volume disposed between the second pulse valve and a third pulse valve with a volume of inert gas;

pulsing the second pulse valve to transfer the volume of inert gas stored in the inert gas storage volume into the vapor space;

pulsing the first pulse valve to release a precursor pulse from the vapor space to the reaction chamber.

25. The gas deposition method of claim 24 further comprising heating the non-vaporized precursor to a temperature that is below a thermal breakdown temperature of the non-vaporized precursor. A gas deposition method comprising:

a) partially filling a first precursor container with a first non-vaporized precursor and providing a vapor space in the first precursor container;

b) closing a first pulse valve disposed along an outlet conduit between the vapor space and a reaction chamber;

c) injecting an inert gas pulse into the vapor space with the first pulse valve closed;

d) closing a second pulse valve disposed along the inlet conduit between the inert gas supply and the vapor space;

e) releasing a precursor pulse comprising the first precursor from the vapor space to the reaction chamber with the second pulse valve closed;

f) reacting the first precursor with a substrate disposed inside the reaction chamber;

g) repeating steps c-f;

h) purging the reaction chamber of the first precursor;

i) releasing a precursor pulse comprising a second precursor into the reaction chamber and reacting the second precursor with the substrate;

j) purging the reaction chamber of the second precursor.

26. The gas deposition method of claim 25 wherein each cycle of the steps b-j comprises depositing a single material layer onto exposed surfaces of the substrate;

further comprising repeating steps b-j until a desired number of material layers are deposited onto the exposed surfaces.

27. The gas deposition method of claim 26 further comprising heating the non-vaporized precursor to a temperature that is below a thermal breakdown temperature of the non-vaporized precursor.

28. The gas deposition method of claim 27 wherein the first precursor container comprises a single port container and steps c and e comprise passing the inert gas pulse and the precursor through the single port.