RADIATION DETECTION APPARATUS AND RADIATION IMAGING SYSTEM

• US 20110315886A1
• Filed: 05/18/2011
• Published: 12/29/2011
• Est. Priority Date: 06/24/2010
• Status: Active Grant

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Sawada, Satoru, Inoue, Masato, Oguri, Noriaki, Takeda, Shinichi, Akiyama, Masayoshi, Takei, Taiki
• Granted Patent: US 8,653,463 B2
• Time in Patent Office: Days
• US Class Current: 250/366
• CPC Class Codes: A61B 6/4208 characterised by using a particular type of detector
• CPC Class Codes: A61B 6/563 involving image data transmission via a network
• CPC Class Codes: H01L 27/14663 Indirect radiation imagers, e.g. using luminescent members
• CPC Class Codes: H01L 31/0203 Containers; Encapsulations , e.g. encapsulation of photodiodesfor photovoltaic devices H01L31/048; for organic photosensitive devices H10K30/80
• CPC Class Codes: H01L 31/115 Devices sensitive to very short wavelength, e.g. X-rays, gamma-rays or corpuscular radiation

Abstract

A radiation detection apparatus comprising semiconductor substrates each having a first surface on which a photoelectric conversion portion is formed and a second surface opposite to the first surface; a scintillator layer, placed over the first surfaces of the semiconductor substrates, for converting radiation into light; and an elastic member, placed between a base and the second surfaces, for supporting the second surfaces of the semiconductor substrates such that the first surfaces of the semiconductor substrates are flush with each other is provided. In measurement of the elastic member as a single body, an amount of stretch of a cubic specimen in a direction parallel to the first surface when being compressed in a direction perpendicular to the first surface is smaller than an amount of stretch of the specimen in the direction perpendicular to the first surface when being compressed in the direction parallel to the first surface.

Claims

1. A radiation detection apparatus comprising:

a plurality of semiconductor substrates each having a first surface on which a photoelectric conversion portion for detecting light is formed and a second surface opposite to the first surface;

a scintillator layer, placed over the first surfaces of the plurality of semiconductor substrates, for converting radiation into light; and

an elastic member, placed between a base and the second surfaces of the plurality of semiconductor substrates, for supporting the second surfaces of the plurality of semiconductor substrates such that the first surfaces of the plurality of semiconductor substrates are flush with each other,

wherein, in measurement of the elastic member as a single body, an amount of stretch of a cubic specimen in a direction parallel to the first surface when being compressed in a direction perpendicular to the first surface is smaller than an amount of stretch of the specimen in the direction perpendicular to the first surface when being compressed in the direction parallel to the first surface.

2. The apparatus according to claim 1, wherein the elastic member includes a base material formed by at least one of unwoven fabric, chemical fiber, and wire mesh.

3. The apparatus according to claim 2, wherein the elastic member further includes a heat-releasable adhesive layer for bonding the plurality of semiconductor substrates to the base material.

4. The apparatus according to claim 2, wherein the elastic member further includes an elastic adhesive layer for bonding the base material to the base.

5. A radiation imaging system comprising:

a radiation detection apparatus according to claim 1; and

a signal processing unit configured to process a signal obtained from the radiation detection apparatus.