Microbolometer for infrared detector or Terahertz detector and method for manufacturing the same
First Claim
1. A microbolometer, comprising a micro-bridge structure, wherein a thermistor material and a light absorbing material of said micro-bridge structure are vanadium oxide-carbon nanotube composite film formed by one-dimensional carbon nanotubes and two-dimensional vanadium oxide film.
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Abstract
A microbolometer includes a micro-bridge structure for uncooling infrared or terahertz detectors. The thermistor and light absorbing materials of the micro-bridge structure are the vanadium oxide-carbon nanotube composite film formed by one-dimensional carbon nanotubes and two-dimensional vanadium oxide film. The micro-bridge is a three-layer sandwich structure consisting of a layer of amorphous silicon nitride base film as the supporting and insulating layer of the micro-bridge, a layer or multi-layer of vanadium oxide-carbon nanotube composite film in the middle of the micro-bridge as the heat sensitive and light absorbing layer of the microbolometer, and a layer of amorphous silicon nitride top film as the stress control layer and passivation of the heat sensitive film. The microbolometer and method for manufacturing the same can overcome the shortcomings of the prior art, improve the performance of the device, reduce the cost of raw materials and is suitable for large-scale industrial production.
25 Citations
20 Claims
- 1. A microbolometer, comprising a micro-bridge structure, wherein a thermistor material and a light absorbing material of said micro-bridge structure are vanadium oxide-carbon nanotube composite film formed by one-dimensional carbon nanotubes and two-dimensional vanadium oxide film.
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3. A method for manufacturing a microbolometer, comprising the steps of:
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(A) cleaning a silicon substrate, depositing a layer of amorphous silicon dioxide film as a passivation layer; (B) depositing a layer of metal aluminum on a surface of the silicon dioxide passivation layer as a reflecting layer of a micro-bridge; (C) photolithographing the patterns of the bridge piers of the suspended micro-bridge on a surface of the metal aluminum, and etching the metal aluminum to the silicon dioxide passivation layer, thus forming micro-bridge pier holes and metal aluminum islands; (D) coating a layer of photosensitive polyimide film in a spin manner on the surfaces of the metal aluminum islands; (E) photolithographing the polyimide film to form polyimide film islands and pier holes of the suspended micro-bridge, and then making the imine treatment; (F) depositing a layer of amorphous silicon nitride film on the surfaces of the polyimide film islands and the pier holes as a supporting and insulating material of the micro-bridge, and then preparing a vanadium oxide-carbon nanotube composite film; (G) depositing a layer of metal and patterning the metal, thus forming electrodes of the device; (H) depositing a layer of amorphous silicon nitride film on the surfaces of the metal electrodes and the vanadium oxide-carbon nanotube composite film as a passivation layer of the electrodes and the heat sensitive film and a stress control layer of the device; (I) photolithographing a pattern of the suspended micro-bridge on a surface of the composite film, etching the composite film to the polyimide layer, thus forming a bridge deck, bridge legs and bridge piers of the suspended micro-bridge; and (J) removing the polyimide film at a bottom of the pattern of the bridge deck and the bridge legs to form the cavity, thus obtaining the microbolometer. - View Dependent Claims (4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification