×

METHOD FOR ADJUSTING A MEASURING DEVICE IN PROCESS ANALYSIS TECHNOLOGY

  • US 20110320158A1
  • Filed: 06/23/2011
  • Published: 12/29/2011
  • Est. Priority Date: 06/24/2010
  • Status: Abandoned Application
First Claim
Patent Images

1. A method for adjusting a measuring device in process analysis technology, wherein the measuring device is arranged remotely from a reference measuring device performing reference measurements, comprising the steps of:

  • comparing measured values of the measuring device to reference measured values of the reference measuring device;

    deriving from said comparison at least one calibration variable for measured values of the measuring device, wherein measured values of the measuring device and reference measured values of the reference measuring device are combined in a central data capture and processing software;

    a calibration value is ascertained by the central data capture and processing software; and

    the calibration variable is transmitted from the central data capture and processing software to the measuring device for adjusting the measured values.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×