PROGRAMMING OF MEMORY CELLS IN A NONVOLATILE MEMORY USING AN ACTIVE TRANSITION CONTROL

• US 20120033491A1
• Filed: 08/04/2010
• Published: 02/09/2012
• Est. Priority Date: 08/04/2010
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Shelton, Douglas Edward, MacPeak, John Howard, Pickelsimer, Bruce Lynn
• Granted Patent: US 8,238,158 B2
• Time in Patent Office: Days
• US Class Current: 365/185.2
• CPC Class Codes: G11C 16/10 Programming or data input circuits
• CPC Class Codes: G11C 16/32 Timing circuits

Abstract

An electrically programmable non-volatile memory array and associated circuitry, including programming circuitry that adaptively senses completed programming of a selected memory cell. A programming bit line driver is connected to the bit line, and a first transistor has its source/drain path connected in series with the memory cell, and its gate connected to the output of the current comparator. As the MOS transistor in the selected cell becomes programmed, its drain current drawn from the bit line driver decays, and a remainder current into the current comparator increases. Upon the remainder current exceeding the reference current, the comparator turns off the first transistor; a second transistor connected between the source and drain of the cell transistor is turned on. In another approach, a summed current controls the gates of the first and second transistors. Programming terminates, and over-programming is avoided.

Claims

1. An integrated circuit comprising:

a programmable solid-state memory array including a plurality of memory cells arranged in rows and columns, each memory cell including a metal-oxide-semiconductor (MOS) transistor having a gate and a source/drain path;

a plurality of word lines, each coupled to the gate of the MOS transistor in memory cells in an associated row of the memory array;

word line drive circuitry, for energizing the word line associated with a selected row of the memory array;

a plurality of bit lines, each associated with memory cells in an associated column of the memory array;

at least one programming bit line driver for driving programming current to one or more of the plurality of bit lines in a programming operation; and

programming logic, comprising;

switch circuitry, for selectively opening and closing a circuit through which the programming current is conducted via the bit line associated with a selected column of the memory array in the programming operation; and

circuitry, having a first input coupled to the bit line of the selected column and having a second input coupled to receive a reference current, for controlling the switch circuitry responsive to a remainder current, the remainder current corresponding to a portion of the programming current not conducted by a memory cell in the selected column and the selected row.

2. The integrated circuit of claim 1, wherein the circuitry for controlling the switch circuitry comprises:

a comparator, having a first input coupled to the bit line of the selected column to receive the remainder current, a second input receiving a reference current, and an output coupled to the programming switch circuitry so that the switch circuitry disconnects opens the circuit responsive to the remainder current exceeding the reference current.

3. The integrated circuit of claim 2, wherein each of the plurality of bit lines is coupled to drains of MOS transistors in memory cells in an associated column of the memory array, the sources of each MOS transistor coupled to a reference voltage;

wherein the switch circuitry is for coupling the programming current to the bit line associated with a selected column of the memory array in a programming operation.

4. The integrated circuit of claim 3, wherein the switch circuitry comprises, for each of the plurality of bit lines:

a first transistor, having a source/drain path connected between an output of the programming bit line driver and a corresponding bit line, and having a gate coupled to the output of the comparator; and

a second transistor, having a source/drain path connected between the corresponding bit line, and the source of one or more MOS transistors in the column corresponding to the bit line, and having a gate coupled to the output of the comparator so that the second transistor is turned on when the first transistor is turned off, and turned off when the first transistor is turned on.

5. The integrated circuit of claim 3, wherein the columns of memory cells in the memory array are arranged into a plurality of groups;

and wherein the programming logic comprises, for each group of columns;

switch circuitry, for coupling a programming current to a bit line associated with a selected column in the corresponding group; and

a comparator, having a first input coupled to the bit line of the selected column in the group, a second input receiving a reference current, and an output coupled to the switch circuitry so that the switch circuitry disconnects the programming current from the bit line responsive to a remainder current at the first input of the comparator exceeding the reference current.

6. The integrated circuit of claim 5, further comprising:

logic circuitry, having a plurality of inputs, each input coupled to an output of the comparator corresponding to one of the plurality of groups, the logic circuitry for issuing a signal indicating completion of a programming operation.

7. The integrated circuit of claim 5, wherein the switch circuitry comprises, for each column in the group:

a first transistor, having a source/drain path connected between an output of the programming bit line driver and a corresponding bit line for the column, and having a gate coupled to the output of the comparator; and

a second transistor of complementary channel conductivity from the first transistor, and having a source/drain path connected between the corresponding bit line, and the source of one or more MOS transistors in the column, and having a gate coupled to the output of the comparator.

8. The integrated circuit of claim 7, wherein the output of the comparator, for a group of columns, is connected to the gates of first and second transistors in each switch circuitry associated with each column in the group.

9. The integrated circuit of claim 2, wherein each of the plurality of bit lines is coupled to drains of MOS transistors in memory cells in an associated column of the memory array;

wherein the sources of each MOS transistor in each of a plurality of groups of columns are connected in common to a source line;

wherein the switch circuitry is for selectively coupling the source line to a reference voltage in a programming operation.

10. The integrated circuit of claim 9, wherein the switch circuitry comprises, for each of the plurality of groups of bit lines:

a first transistor, having a source/drain path connected between the output of the programming bit line driver and the source line, and having a gate coupled to the output of the comparator; and

a second transistor, having a source/drain path connected between the source line and the reference voltage, and having a gate coupled to the output of the comparator so that the second transistor is turned on when the first transistor is turned off, and turned off when the first transistor is turned on.

11. The integrated circuit of claim 1, wherein the circuitry for controlling the switch circuitry comprises:

a current mirror, having an input coupled to bit line of the selected column to receive the remainder current, and having an output;

a reference circuit, having an input coupled to an output of the programming bit line driver, and having an output for presenting the reference current; and

an amplifier, having an input coupled to a summing node coupled to the outputs of the current mirror and the reference circuit, and having an output coupled to the switch circuitry, for presenting a voltage corresponding to a sum of the reference current and the remainder current.

12. The integrated circuit of claim 11, wherein the switch circuitry comprises:

a first transistor, having a source/drain path connected between an output of the programming bit line driver and a corresponding bit line, and having a gate coupled to the output of the amplifier; and

a second transistor, having a source/drain path connected between the corresponding bit line, and the source of one or more MOS transistors in the column corresponding to the bit line, and having a gate coupled to the output of the amplifier so that the second transistor is turned on when the first transistor is turned off, and turned off when the first transistor is turned on.

13. The integrated circuit of claim 1, further comprising:

a programming source coupled to an input of the programming bit line driver, for generating a programming voltage.

14. The integrated circuit of claim 13, wherein the programming source comprises:

a charge pump circuit.

15. The integrated circuit of claim 1, wherein the integrated circuit further comprises:

a logic circuit coupled to the memory array.

16. The integrated circuit of claim 1, wherein the gate of the MOS transistor of each of the plurality of memory cells comprises:

a floating gate electrode; and

a control gate electrode.

17. A method of programming memory cells in a programmable solid-state memory array including a plurality of memory cells arranged in rows and columns, wherein each memory cell includes a metal-oxide-semiconductor (MOS) transistor comprising a gate and a source/drain path, the method comprising the steps of:

applying a programming current to the drain of the MOS transistor of a selected memory cell, the source of the MOS transistor of the selected memory cell being coupled to a reference voltage;

during the step of applying the programming current, comparing a remainder current from the drain of the MOS transistor of the selected memory cell to a reference current; and

responsive to the remainder current exceeding the reference current, turning off a first switch transistor to open a circuit including the source/drain path of the MOS transistor of the selected memory cell in series with the first switch transistor.

18. The method of claim 17, wherein the source/drain path of the first switch transistor is connected between a programming current source and the drain of the MOS transistor of the selected memory cell.

19. The method of claim 18, further comprising:

responsive to the remainder current exceeding the reference current, turning on a second switch transistor, the second switch transistor having a source/drain path connected between the source and drain of the MOS transistor of the selected memory cell.

20. The method of claim 19, wherein the comparing step comprises:

applying the reference current to a first input of a comparator;

coupling a second input of the comparator to the drain of the MOS transistor of the selected memory cell;

coupling an output of the comparator to a gate of each of the first and second switch transistors.

21. The method of claim 17, wherein the source/drain path of the first switch transistor is connected between the source of the MOS transistor of the selected memory cell and a reference voltage.

22. The method of claim 21, further comprising:

responsive to the remainder current exceeding the reference current, turning on a second switch transistor, the second switch transistor having a source/drain path connected between the source and drain of the MOS transistor of the selected memory cell.

23. The method of claim 22, wherein the comparing step comprises:

applying the reference current to a first input of a comparator;

coupling a second input of the comparator to the drain of the MOS transistor of the selected memory cell;

coupling an output of the comparator to a gate of each of the first and second switch transistors.

24. The method of claim 17, wherein the applying step simultaneously applies a programming current to the drain of a MOS transistor of a plurality of selected memory cells in a plurality of columns of the memory array;

wherein the comparing step is performed for each of the plurality of selected cells in the plurality of columns;

and wherein the turning off step is performed for each of the plurality of selected cells in the plurality of columns.

25. The method of claim 24, further comprising:

generating a programming completion signal responsive to a logic operation on the output of the comparator corresponding to each of the plurality of selected cells.

26. The method of claim 25, further comprising:

after the generating step, repeating the applying, comparing, and generating steps for each of the memory cells in a block of the memory array; and

then erasing the memory cells in the block of the memory array.

27. The method of claim 17, wherein the applying step comprises:

operating a charge pump to generate a programming voltage; and

applying the programming voltage at an output of the charge pump to a bit line driver in a programming operation.

28. The method of claim 17, wherein the applying step comprises:

operating an off-chip circuit to generate a programming voltage; and

applying the programming voltage to a terminal of an integrated circuit including the solid-state memory array, for coupling to a bit line driver in a programming operation.

29. A method of programming memory cells in a programmable solid-state memory array including a plurality of memory cells arranged in rows and columns, wherein each memory cell includes a metal-oxide-semiconductor (MOS) transistor comprising a gate and a source/drain path, the method comprising the steps of:

applying a programming current to the drain of the MOS transistor of a selected memory cell;

responsive to the applying step, generating a reference current;

during the step of applying the programming current, summing a remainder current from the drain of the MOS transistor of the selected memory cell with the reference current;

generating a control voltage responsive to the sum of the remainder and reference currents; and

responsive to the control voltage exceeding a threshold voltage, turning off a first switch transistor to open a circuit including the source/drain path of the MOS transistor of the selected memory cell in series with the first switch transistor.

30. The method of claim 29, further comprising:

applying the remainder current to a current mirror, wherein a current at the output of the current mirror is applied to the summing node along with the reference current.

31. The method of claim 29, wherein the first switch transistor has a source/drain path connected in series between a source of the programming current and the drain of the MOS transistor of the selected memory cell;

and

wherein the source of the MOS transistor of the selected memory cell is coupled to a reference voltage.

32. The method of claim 31, further comprising:

responsive to the control voltage exceeding a threshold voltage, turning on a second switch transistor having a source/drain path connected between the source and the drain of the MOS transistor of the selected memory cell.

33. The method of claim 29, wherein the first switch transistor has a source/drain path connected in series between a reference voltage and the source of the MOS transistor of the selected memory cell.

34. The method of claim 33, further comprising:

responsive to the control voltage exceeding a threshold voltage, turning on a second switch transistor having a source/drain path connected between the source and the drain of the MOS transistor of the selected memory cell.