APPARATUS AND METHODS FOR DETECTING A CONDUCTIVE OBJECT AT A LOCATION

• US 20120044201A1
• Filed: 08/05/2011
• Published: 02/23/2012
• Est. Priority Date: 05/18/2006
• Status: Active Grant

• Current Assignee: Wistron Corporation
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: XiaoPing, Jiang
• Granted Patent: US 8,174,507 B2
• Time in Patent Office: Days
• US Class Current: 345/174
• CPC Class Codes: G06F 2203/04111 Cross over in capacitive digitiser, i.e. details of structures for connecting electrodes of the sensing pattern where the connections cross each other, e.g. bridge structures comprising an insulating layer, or vias through substrate
• CPC Class Codes: G06F 3/0445 using two or more layers of sensing electrodes, e.g. using two layers of electrodes separated by a dielectric layer
• CPC Class Codes: G06F 3/0446 using a grid-like structure of electrodes in at least two directions, e.g. using row and column electrodes

Abstract

A method and apparatus to detect a conductive object at a location determines a capacitance variation of a first sensor element and a capacitance variation of a second sensor element. The method and apparatus detects a touch at a first location if the capacitance variation of the first sensor element is greater than a reference value and the capacitance variation of the second sensor element is not greater than the reference value. The method and apparatus detects the touch at a second location if the capacitance variation of the first sensor element is not greater than the reference value and the capacitance variation of the second sensor element is greater than the reference value. The method and apparatus detects the touch at a third location if the capacitance variation of the first sensor element and the capacitance variation of the second sensor element are both greater than the reference value.

Claims

1. A method comprising:

determining a capacitance variation of a first sensor element and a capacitance variation of a second sensor element;

detecting a touch at a first location if the capacitance variation of the first sensor element is greater than a reference value and the capacitance variation of the second sensor element is not greater than the reference value;

detecting the touch at a second location if the capacitance variation of the first sensor element is not greater than the reference value and the capacitance variation of the second sensor element is greater than the reference value; and

detecting the touch at a third location if the capacitance variation of the first sensor element and the capacitance variation of the second sensor element are both greater than the reference value.

2. The method of claim 1, wherein the determining of the capacitance variation of the first sensor element and the capacitance variation of the second sensor element includes sequentially measuring a capacitance of the first sensor element and a capacitance of the second sensor element.

3. The method of claim 2, wherein sequentially measuring the capacitance of the first sensor element and the capacitance of the second sensor element includes using a selection circuit to select a first conductive path coupled to the first sensor element and to select a second conductive path coupled to the second sensor element, wherein the capacitance of the first sensor element is measured through the first conductive path and the capacitance of the second sensor element is measured through the second conductive path.

4. The method of claim 2, wherein sequentially measuring the capacitance of the first sensor element and the capacitance of the second sensor element includes using a selection circuit to select the first sensor element to measure over a conductive path and to select the second sensor element to measure over the conductive path.

5. The method of claim 1, wherein the determining of the capacitance variation of the first sensor element and the capacitance variation of the second sensor element includes using a single capacitance sensor to measure a capacitance of the first sensor element and to measure a capacitance of the second sensor element.

6. The method of claim 5, wherein the single capacitance sensor includes a relaxation oscillator.

7. The method of claim 1, wherein the first location, the second location, and the third location reside on a common axis.

8. An apparatus comprising:

a first sensor element;

a second sensor element that is electrically isolated from the first sensor element; and

a processing device coupled with the first sensor element and the second sensor element, wherein the processing device is configured to;

detect a presence at a first location based on a first change in capacitance of the first sensor element;

detect the presence at a second location based on a first change in capacitance of the second sensor element; and

detect the presence at a third location based on a second change in capacitance of the first sensor element and a second change in capacitance of the second sensor element.

9. The apparatus of claim 8, wherein the processing device comprises one or more capacitance sensors configured to measure capacitance of the first sensor element and the second sensor element.

10. The apparatus of claim 9, wherein each of the one or more capacitance sensors comprise a relaxation oscillator configured to measure capacitance.

11. The apparatus of claim 9, wherein the processing device comprises a first pin coupled to the first sensor element and a second pin coupled to the second sensor element, wherein the processing device is configured to measure a capacitance of the first sensor element through the first pin and measure a capacitance of the second sensor element through the second pin.

12. The apparatus of claim 9, wherein the processing device comprises a pin coupled to the first sensor element and coupled to the second sensor element, wherein the processing device is configured to measure a capacitance of the first sensor element through the pin and measure a capacitance of the second sensor element through the pin.

13. The apparatus of claim 12, wherein the processing device is configured to use a selection circuit to sequentially select the first sensor element and the second sensor element for measurement through the pin.

14. A system comprising:

a user interface comprising a multi-dimensional sensor array, the multi-dimensional sensor array including a plurality of sensor elements; and

a processing device coupled to the user interface, the processing device configured to;

determine a capacitance variation of a first sensor element and a capacitance variation of a second sensor element, the first sensor element and the second sensor element of the plurality of sensor elements;

detect a touch at a first location of the multi-dimensional sensor array responsive to the capacitance variation of the first sensor element being greater than a reference value and the capacitance variation of the second sensor element not being greater than the reference value;

detect the touch at a second location of the multi-dimensional sensor array responsive to the capacitance variation of the first sensor element not being greater than the reference value and the capacitance variation of the second sensor element being greater than the reference value; and

detect the touch at a third location of the multi-dimensional sensor array responsive to the capacitance variation of the first sensor element and the capacitance variation of the second sensor element both being greater than the reference value.

15. The system of claim 14, wherein the processing device is configured to sequentially measure a capacitance of the first sensor element and a capacitance of the second sensor element as part of the determination of the capacitance variation of the first sensor element and the capacitance variation of the second sensor element.

16. The system of claim 15, wherein the processing device is configured to use a selection circuit to select a first conductive path coupled to the first sensor element and to select a second conductive path coupled to the second sensor element, wherein the processing device is configured to measure the capacitance of the first sensor element through the first conductive path and measure the capacitance of the second sensor element through the second conductive path.

17. The system of claim 15, wherein the processing device is configured to use a selection circuit to select the first sensor element to measure over a conductive path and to select the second sensor element to measure over the conductive path.

18. The system of claim 14, wherein the processing device includes a capacitance sensor to measure a capacitance of the first sensor element and to measure a capacitance of the second sensor element.

19. The system of claim 18, wherein the capacitance sensor includes a relaxation oscillator.

20. The system of claim 14, wherein the first location, the second location, and the third location reside on a common axis of the multi-dimensional sensor array.