PROCESS FLUID TEMPERATURE MEASUREMENT

• US 20120051399A1
• Filed: 08/26/2010
• Published: 03/01/2012
• Est. Priority Date: 08/26/2010
• Status: Active Grant

• Current Assignee: Rosemount Incorporated (Emerson Electric Company)
• Original Assignee: Rosemount Incorporated (Emerson Electric Company)
• Inventors: Rud, Jason H., Engelstad, Loren M.
• Granted Patent: US 8,449,181 B2
• Time in Patent Office: Days
• US Class Current: 374/185
• CPC Class Codes: G01K 15/00 Testing or calibrating of thermometers
• CPC Class Codes: G01K 15/007 Testing
• CPC Class Codes: G01K 7/20 in a specially-adapted circuit, e.g. bridge circuit

Abstract

An apparatus for measuring a temperature of a process fluid includes a resistance based temperature sensor (RTD) sensor configured to thermally couple to the process fluid. First and second electrical connections are configured to apply a current through the RTD. Measurement circuitry is configured to measure a voltage across the RTD and identify a degraded connection to the RTD and responsively measure a temperature of the process fluid using the electrical connections.

Claims

1. An apparatus for measuring a temperature of a process fluid comprising:

a resistance based temperature sensor (RTD) sensor configuration to thermally couple to the process fluid;

first and second electrical connections configured to apply a current through an RTD;

third and fourth electrical connections configured to measure a voltage across the RTD; and

measurement circuitry configured to identify a degraded connection to the RTD and responsively measure a temperature of the process fluid using less than all of the first, second, third and fourth electrical connections, wherein the measurement circuitry is configured to measure the temperature of the process fluid during an occurrence of a degraded connection to the RTD.

2. The apparatus of claim 1 wherein the degraded connection is detected based upon a change in EMF or line resistance in any line.

3. The apparatus of claim 1 wherein the measurement circuitry is configured to measure the temperature of the process fluid using three connections to the RID.

4. The apparatus of claim 1 wherein the measurement circuitry is configured to measure the temperature of the process fluid using two connections to the RTD.

5. The apparatus of claim 1 wherein the first and second connections to the RTD couple to a first side of the RTD and wherein either of the first and second connections can be configured to selectively provide the current through the RTD.

6. The apparatus of claim 1 including a reference resistor and wherein the temperature measurement is related to a comparison of a resistance of the RID to the resistance of the reference resistor.

7. The apparatus of claim 1 including circuitry configured to provide an output on a process control loop.

8. The apparatus of claim 7 wherein the process control loop comprises a two wire process control loop which is further configured to power circuitry of the apparatus.

9. The apparatus of claim 7 wherein the process control loop comprises a wireless process control loop.

10. The apparatus of claim I including an I/O circuitry configured to provide an output indicating a degraded connection to the RTD has been detected.

11. The apparatus of claim 10 wherein the output is provided on a process control loop.

12. A method of sensing temperature of a process fluid, comprising:

thermally coupling a resistance based temperature sensor (RTD) to the process fluid;

causing a current to flow through the RTD using a first and second connection to the RTD;

measuring a voltage across the RTD using a third and a fourth connection to the RTD;

identifying a degraded connection to the RTD based upon a change in EMF or line resistance; and

responsively measuring a temperature of the process fluid using less than all of the first, second, third and fourth connections to the RTD wherein the measuring of the temperature occurs during an occurrence of a degraded connection to the RTD.

13. The method of claim 12 wherein the resistance of the RTD is measured using three connections to the RTD.

14. The method of claim 12 wherein resistance of the RTD is measured using two connections to the RTD.

15. The method of claim 12 wherein the first and second connections to the RTD couple to a first side of the RTD and wherein either of the first and second connections can be configured to selectively provide the current through the RTD.

16. The method of claim 12 including providing a reference resistor and wherein the temperature measurement is related to a comparison of a resistance of the RTD to the resistance of the reference resistor.

17. The method of claim 12 including providing an output on a process control loop related to sensed temperature.

18. The method of claim 17 wherein the process control loop comprises a two wire process control loop.

19. The method of claim 17 wherein the process control loop comprises a wireless process control loop.

20. The method of claim 12 including providing an output indicating a degraded connection to the RTD has been detected.

21. The method of claim 20 wherein the output is provided on a process control loop.