Computer-implemented systems and methods for detecting electrostatic discharges and determining their origination locations

• US 20120072139A1
• Filed: 09/17/2010
• Published: 03/22/2012
• Est. Priority Date: 09/17/2010
• Status: Active Grant

• Current Assignee: Aerospace Corporation
• Original Assignee: Aerospace Corporation
• Inventors: Reed, C. Christopher, Newbauer, Tom R., Briët, Richard
• Granted Patent: US 8,370,091 B2
• Time in Patent Office: Days
• US Class Current: 702/59
• CPC Class Codes: G01R 31/001 Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing measuring electromagnetic fields G01R29/08; circuits for generating HV pulses in dielectric strength testing G01R31/14

Abstract

Computer-implemented systems and methods for detecting ESD on a surface and determining an origination location of the ESD. A programmed computer device monitors time-varying current data related to the surface to detect ESD on the surface. The current profile for the surface may be compared to a catalog of ESD current profiles, where each ESD current profile in the catalog corresponds to a different location on the surface. The location on the surface whose corresponding ESD current profile best matches the actual current profile from the ESD may be determined to be the origination location of the ESD. Moderately different processes may be used to determine the ESD origination location depending on whether the surface is symmetrical or irregular, flat or curved, etc.

Claims

1. A computer system for determining the origination location of an electrostatic discharge (ESD) on a surface, the computer system comprising:

at least one processor;

a data store in communication with the at least one processor, wherein the data store stores a plurality of ESD current profiles, each ESD profile corresponding to a different location on the surface; and

at least one memory unit in communication with the at least one processor, wherein the at least one memory unit includes instructions that are executed by the at least one processor such that the at least one processor is programmed to;

receive actual current data indicative of time-varying current conducted by the surface;

compare the actual current data to the plurality of ESD current profiles; and

determine the origination location of the ESD on the surface based on the comparison.

2. The computer system of claim 1, wherein the at least one processor is further programmed to detect ESD on the surface based on the actual current data.

3. The computer system of claim 1, wherein the surface is flat.

4. The computer system of claim 1, wherein the surface is non-flat.

5. The computer system of claim 3, wherein the surface comprises a solar panel, the solar panel comprising an array of solar cells.

6. The computer system of claim 1, wherein the at least one processor is programmed to compare the actual current data to the plurality of ESD current profiles by determining an area bounded between a current profile for the actual current data to each of the plurality of ESD current profiles.

7. The computer system of claim 6, wherein the at least one processor is programmed to determine the origination location of the ESD on the surface by determining that the location on the surface corresponding to the ESD current profile closest to the current profile for the actual current data is the ESD origination location.

8. An apparatus comprising:

at least one solar panel, the at least one solar panel comprising;

a plurality of solar cells; and

a power bus connected to strings of solar cells, wherein the power bus conducts current generated by the plurality of solar cells;

at least one power bus current probe that senses current in the power bus of the at least one solar panel;

an ESD detection/location system comprising at least one processor and at least one memory unit, wherein the ESD detection/location system is capable of receiving current data indicative of current on the at least one power bus, wherein the ESD detection/location system is programmed to determine an origination location of ESD on the at least one solar panel by comparing current data input from the at least one power bus current probe to a plurality of ESD current profiles that are stored in a data store of the ESD detection/location system, each ESD profile corresponding to a different location on the at least one solar panel.

9. The apparatus of claim 8, further comprising a power source connected to the power bus.

10. The apparatus of claim 8, wherein the at least one solar panel is flat.

11. The apparatus of claim 8, wherein the at least one solar panel is non-flat.

12. The apparatus of claim 8, wherein:

the at least one solar panel is asymmetrical; and

the ESD detection/location system is programmed to compare the current data input from the at least one power bus current probe to the plurality of ESD current profiles by determining an area bounded between a current profile for the current data input from the at least one power bus current probe and each of the plurality of ESD current profiles, wherein the origination location of the ESD on the at least one solar panel corresponds to the location on the at least one solar panel whose corresponding ESD current profile has the least bounded area difference relative to the current profile for the current data input from the at least one power bus current probe.

13. The apparatus of claim 12, wherein the ESD detection/location system is further programmed to detect ESD on the at least one solar panel based on the current data input from the at least one power bus current probe.

14. The apparatus of claim 8, wherein:

the at least one solar panel is symmetrical, having n axes of symmetry, wherein n≧

1;

the apparatus further comprises;

a plurality of conductive strings connected to respective, discrete groups of the plurality of solar cells of the at least one solar panel, wherein the plurality of conductive strings are connected to the power bus; and

a plurality of string current probes, wherein each of the plurality of string current probes is connected to a separate one of the plurality of conductive strings; and

the ESD detection/location system is programmed to determine the origination location of the ESD by;

determining at least the 2n most probable ESD origination locations by comparing the current data input from the at least one power bus current probe to the plurality of ESD current profiles, wherein the 2n most probable ESD origination locations correspond to the 2n solar panel locations whose corresponding ESD current profiles have the 2n least bounded area differences relative to a current profile for the current data input from the at least one power bus current probe; and

determining the ESD origination location from the 2n most probable ESD origination locations based on current input data from the plurality of string current probes.

15. The apparatus of claim 14, wherein the ESD detection/location system is further programmed to detect ESD on the at least one solar panel based on the current data input from the at least one power bus current probe.

16. A computer-implemented method for determining an origination location of electrostatic discharge (ESD) on a surface, the method comprising:

receiving and storing actual current data indicative of time-varying current on the surface by a programmable computer device;

comparing by the programmable computer device the received actual current data to a plurality of ESD current profiles stored in a data store for the programmable computer device, wherein each ESD profile corresponds to a different location on the surface; and

determining by the programmable computer device the origination location of the ESD on the surface based on the comparison.

17. The method of claim 16, further comprising detecting by the programmable computer device ESD on the surface based on the actual current data.

18. The method of claim 17, wherein:

the surface is an asymmetrical solar panel that comprises a plurality of solar cells;

the programmable computer device receives current data from a power bus current probe that senses current conducted by a power bus, wherein the power bus is connected to the plurality of solar cells; and

the step of comparing the received actual current data to the plurality of ESD current profiles comprises determining an area difference bounded by a current profile for the current data input of interest and each of the plurality of ESD current profiles, wherein the origination location of the ESD on the solar panel corresponds to the location on the solar panel whose corresponding ESD current profile has a least bounded area difference relative to the current profile for the current data input from the power bus current probe.

19. The method of claim 17, wherein:

the surface is a symmetrical solar panel that comprises a plurality of solar cells, wherein the solar panel has n axes of symmetry, wherein n≧

1;

the programmable computer device receives actual current data from;

a power bus current probe that senses current conducted by a power bus, wherein the power bus is connected to the plurality of current strings; and

a plurality of string current probes, wherein each of the plurality of string current probes is connected to a separate one of a plurality of conductive strings, wherein the plurality of conductive strings are connected to respective, discrete groups of the plurality of solar cells, wherein the plurality of conductive strings are connected to the power bus;

the step of comparing the received actual current data to the plurality of ESD current profiles comprises determining at least the 2n most probable ESD origination locations by comparing the current data input from the power bus current probe to the plurality of ESD current profiles, wherein the 2n most probable ESD origination locations correspond to the solar panel locations whose corresponding ESD current profiles have the 2n least bounded area differences relative to a current profile for the current data input from the power bus current probe; and

the step of determining the origination location of the ESD comprises determining the ESD origination location from the 2n most probable ESD origination locations based on current input data from the plurality of string current probes.