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MEMORY TESTER AND COMPILER WHICH MATCHES A TEST PROGRAM

  • US 20120072792A1
  • Filed: 03/17/2011
  • Published: 03/22/2012
  • Est. Priority Date: 09/17/2010
  • Status: Abandoned Application
First Claim
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1. A memory tester comprising:

  • a first operation register to store a first operation variable;

    a second operation register to store a second operation variable;

    a first selector to output the first or second operation variables stored in the first and second operation registers, selectively, as a burst address operation variable, based on a selection signal,a first burst address generating circuit capable of generating a first burst address signal based on the first operation variable outputted from the first selector; and

    .a second burst address generating circuit capable of generating a second burst address signal based on the second operation variable outputted from the first selector.

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