SHIFT REGISTER

• US 20120082287A1
• Filed: 05/17/2010
• Published: 04/05/2012
• Est. Priority Date: 05/20/2009
• Status: Abandoned Application

• Current Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Original Assignee: Sharp Kabushiki Kaisha (Hon Hai Precision Industry Co., Ltd.)
• Inventors: Moriwaki, Hiroyuki
• Application Number:
  US13/321,674
• Publication Number:
  US 20120082287A1
• Time in Patent Office: Days
• US Class Current: 377/64
• CPC Class Codes: G09G 2310/0267 Details of drivers for scan electrodes, other than drivers for liquid crystal, plasma or OLED displays
• CPC Class Codes: G09G 2310/0275 Details of drivers for data electrodes, other than drivers for liquid crystal, plasma or OLED displays, not related to handling digital grey scale data or to communication of data to the pixels by means of a current
• CPC Class Codes: G09G 2310/0286 Details of a shift registers arranged for use in a driving circuit
• CPC Class Codes: G09G 2330/021 Power management, e.g. power saving
• CPC Class Codes: G09G 3/3275 Details of drivers for data electrodes
• CPC Class Codes: G09G 3/3674 Details of drivers for scan electrodes
• CPC Class Codes: G09G 3/3685 Details of drivers for data electrodes
• CPC Class Codes: G11C 19/28 using semiconductor elements G11C19/14, G11C19/36 take precedence
• CPC Class Codes: H01L 27/12 the substrate being other than a semiconductor body, e.g. an insulating body
• CPC Class Codes: H01L 29/41733 for thin film transistors with insulated gate
• CPC Class Codes: H01L 29/78696 characterised by the structure of the channel, e.g. multichannel, transverse or longitudinal shape, length or width, doping structure, or the overlap or alignment between the channel and the gate, the source or the drain, or the contacting structure of the channel H01L29/78612 takes precedence; transistors having a drain offset region or a lightly doped drain [LDD] H01L29/78621

Abstract

A shift register of the present invention is a shift register supported by an insulative substrate, wherein: the shift register includes a plurality of stages each sequentially outputting output signals from an output terminal; each of the plurality of stages includes a first transistor (MA) for pulling up a potential of the output terminal, a plurality of second transistors (ME and MF) whose source region or drain region is electrically connected to a gate electrode of the first transistor (MA), and at least one third transistor (MCd) receiving a clock signal supplied to a gate electrode thereof; and the at least one third transistor (MCd) includes a multi-channel transistor (MCd) having an active layer including at least two channel regions, a source region and a drain region. This improves characteristics of a shift register forming a monolithic gate driver.

Claims

1. A shift register supported by an insulative substrate, wherein:

the shift register includes a plurality of stages each sequentially outputting output signals from an output terminal;

each of the plurality of stages includes a first transistor for pulling up a potential of the output terminal, a plurality of second transistors whose source region or drain region is electrically connected to a gate electrode of the first transistor, and at least one third transistor receiving a clock signal supplied to a gate electrode thereof; and

the at least one third transistor includes a multi-channel transistor having an active layer including at least two channel regions, a source region and a drain region.

2. The shift register according to claim 1, wherein the at least one third transistor includes a third transistor of a first type whose source region or drain region is electrically connected a source region or a drain region of the first transistor, and the third transistor of the first type is the multi-channel transistor.

3. The shift register according to claim 1, wherein:

each of the plurality of stages further includes a fourth transistor for pulling down the potential of the output terminal to VSS; and

the at least one third transistor includes a third transistor of s second type whose source region or drain region is electrically connected a gate electrode of the fourth transistor, and the third transistor of the second type is the multi-channel transistor.

4. The shift register according to claim 1, wherein the plurality of second transistors include a multi-channel transistor having an active layer including at least two channel regions, a source region and a drain region.

5. The shift register according to claim 1, wherein the active layer includes a semiconductor film having an amorphous phase.

6. The shift register according to claim 5, wherein the semiconductor film is a micro-crystalline semiconductor film.

7. The shift register according to any on of claim 1, wherein:

the gate electrode of the multi-channel transistor has a portion that overlaps with the source region and the drain region;

an area of a portion of the gate electrode that overlaps with the drain region and an area of a portion of the gate electrode that overlaps with the source region are different from each other; and

the area of the portion that is connected to the gate electrode of the first transistor is smaller than the area of the portion that is not connected to the gate electrode of the first transistor.

8. The shift register according to claim 1, wherein the source region and the drain region of the first transistor have different sizes from each other, and one that is not connected to a gate bus line is smaller than one that is connected to the gate bus line.

9. The shift register according to claim 1, wherein

the active layer of the multi-channel transistor further includes at least one intermediate region formed between the at least two channel regions, and the at least two channel regions include a first channel region formed between the source region and the at least one intermediate region and a second channel region formed between the drain region and the at least one intermediate region;

the multi-channel transistor further includes;

a contact layer including a source contact region in contact with the source region, a drain contact region in contact with the drain region, and at least one intermediate contact region in contact with the at least one intermediate region; and

a source electrode in contact with the source contact region, a drain electrode in contact with the drain contact region, and at least one intermediate electrode in contact with the at least one intermediate contact region;

the gate electrode of the multi-channel transistor opposes the at least two channel regions and the at least one intermediate region with a gate insulating film interposed therebetween; and

an entirety of a portion of the at least one intermediate electrode that is present between the first channel region and the second channel region overlaps with the gate electrode with the at least one intermediate region and the gate insulating film interposed therebetween.

10. The shift register according to claim 9, wherein:

the gate electrode of the multi-channel transistor includes a portion that overlaps with the source region and the drain region; and

an area of a portion of the gate electrode that overlaps with one of the source region and the drain region that is connected to the gate electrode of the first transistor is smaller than an area of a portion of the gate electrode that overlaps with the at least one intermediate region.

11. The shift register according to claim 9, wherein as seen in a direction vertical to the substrate, the at least one intermediate electrode of the multi-channel transistor includes a depressed portion, and the drain electrode includes a protruding portion in the depressed portion of the at least one intermediate electrode.

12. The shift register according to claim 9, wherein as seen in a direction vertical to the substrate, the source electrode of the multi-channel transistor includes a depressed portion, and the at least one intermediate electrode includes a protruding portion in the depressed portion of the source electrode.

13. The shift register according to claim 9, wherein:

the at least one intermediate region of the multi-channel transistor includes a first intermediate region and a second intermediate region, the at least one intermediate contact region includes a first intermediate contact region and a second intermediate contact region, and the at least one intermediate electrode includes a first intermediate electrode and a second intermediate electrode; and

the at least two channel regions further include a third channel region, with the first channel region formed between the source electrode and the first intermediate electrode, the second channel region formed between the drain electrode and the second intermediate electrode, and the third channel region formed between the first intermediate electrode and the second intermediate electrode.

14. An active matrix substrate comprising the shift register according to claim 1.

15. A display panel comprising the shift register according to claim 1.