OPTICAL METHOD FOR PRECISE THREE-DIMENSIONAL POSITION MEASUREMENT
First Claim
Patent Images
1. A method of measuring three coordinates of an object in space by a single beam of light comprising:
- providing an interferometer comprising a sensing arm;
affixing a position-sensing photodetector to said object;
using said photodetector as a sensing arm of said interferometer;
measuring one of said coordinates interferometrically; and
measuring the remaining said coordinates by measuring electrical signals generated by said photodetector.
0 Assignments
0 Petitions
Accused Products
Abstract
We disclose a method for accurate three-dimensional position measurement in the field of nano-positioning using a single light beam and principles of interferometry to measure position.
-
Citations
9 Claims
-
1. A method of measuring three coordinates of an object in space by a single beam of light comprising:
-
providing an interferometer comprising a sensing arm; affixing a position-sensing photodetector to said object; using said photodetector as a sensing arm of said interferometer; measuring one of said coordinates interferometrically; and measuring the remaining said coordinates by measuring electrical signals generated by said photodetector. - View Dependent Claims (2, 4, 5, 6, 7, 8, 9)
-
-
3. The method of claim I further comprising providing the accuracy of determination of coordinates of said object in plane of said photodetector between 0.1 nm and 10 nm for said coordinates disposed within 100 μ
- m from the center of said photodetector.
Specification