SEMICONDUCTOR DEVICE HAVING BIT LINES AND LOCAL I/O LINES
First Claim
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1. A semiconductor device comprising:
- a selection signal line supplied with a selection signal;
a plurality of first and second local I/O lines;
a plurality of first and second bit lines;
a plurality of first transistors each having a control electrode, each of the first transistors being coupled between an associated one of the first local I/O lines and an associated one of the first bit lines;
a plurality of second transistors each having a control electrode, each of the second transistors being coupled between an associated one of the second local I/O lines and an associated one of the second bit lines;
a first via conductor coupled between the selection signal line and the control electrodes of the first transistors;
a second via conductor coupled between the selection signal line and the control electrodes of the second transistors; and
a failure detecting circuit that detects a defect of at least one of the first and second via conductors by comparing a plurality of first data on the first local I/O lines read from the first bit lines and a plurality of second data on the second local I/O lines read from the second bit lines.
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Abstract
The present invention efficiently decides line failure and contact failure in a semiconductor device. The semiconductor device has a plurality of bit line groups in which connection with local I/O lines is controlled by the same column selection signal line. A failure detecting circuit compares a first data group read from a first bit line group and a second data group read from a second bit line group to detect whether or not connection failure (contact failure) with the column selection signal line occurs in one of the first and second bit line groups.
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Citations
20 Claims
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1. A semiconductor device comprising:
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a selection signal line supplied with a selection signal; a plurality of first and second local I/O lines; a plurality of first and second bit lines; a plurality of first transistors each having a control electrode, each of the first transistors being coupled between an associated one of the first local I/O lines and an associated one of the first bit lines; a plurality of second transistors each having a control electrode, each of the second transistors being coupled between an associated one of the second local I/O lines and an associated one of the second bit lines; a first via conductor coupled between the selection signal line and the control electrodes of the first transistors; a second via conductor coupled between the selection signal line and the control electrodes of the second transistors; and a failure detecting circuit that detects a defect of at least one of the first and second via conductors by comparing a plurality of first data on the first local I/O lines read from the first bit lines and a plurality of second data on the second local I/O lines read from the second bit lines. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A semiconductor device, comprising:
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first to fourth memory cells; first to fourth bit lines connected to the respective first to fourth memory cells; first to fourth transistors connected to the respective first to fourth bit lines; first to fourth lines connected to the respective first to fourth transistors; a selection signal line including a first branch line diverged from the selection signal line and a second branch line diverged from the selection line, the first branch line being connected to gates of the first and second transistors, the second branch line being connected to gates of the third and fourth transistors; a first comparator including a first input connected to the first and third lines; and a second comparator including a second input connected to the second and fourth lines. - View Dependent Claims (20)
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Specification