IMPEDANCE DESIGN METHOD

• US 20120159413A1
• Filed: 02/29/2012
• Published: 06/21/2012
• Est. Priority Date: 01/26/2010
• Status: Active Grant

• Current Assignee: Himax Technologies Ltd. (Himax Technologies Incorporated)
• Original Assignee: Himax Technologies Ltd. (Himax Technologies Incorporated)
• Inventors: HSU, Hsing-Chou, CHEN, Tung-Yang, YANG, Sheng-Fan
• Granted Patent: US 8,332,804 B2
• Time in Patent Office: Days
• US Class Current: 716/112
• CPC Class Codes: G06F 2119/06 Power analysis or power optimisation
• CPC Class Codes: G06F 30/36 Circuit design at the analogue level

Abstract

The invention discloses a chipset having N input/output (I/O) ports coupled to a voltage source which have an observation I/O port. The method includes calculating a first set of impedances at a predetermined frequency or the observation I/O port, if the voltage source is internally coupled to the N I/O ports within the chipset, and calculating a second set of impedances at the predetermined frequency for the observation I/O port, if the voltage source is externally coupled to the N I/O ports through a carrier coupling the core chip to the voltage source. The first set of impedances are compared to the second set of impedances, and the impedance of the power network or the impedance of the carrier is adjusted according to the comparison result.

Claims

1. chipset having N input/output (I/O) ports coupled to a voltage source which have an observation I/O port, comprising:

calculating a first set of impedances at a predetermined frequency for the observation I/O port, if the voltage source is externally coupled to the N I/O ports through a first carrier coupling the core chip to the voltage source, wherein the first set of impedances comprises a self-impedance of the observation I/O port and mutual impedances of the observation I/O port with respect to other I/O ports;

calculating a second set of impedances at the predetermined frequency for the observation I/O port, if the voltage source is externally coupled to the N I/O ports through a second carrier coupling the core chip to the voltage source, wherein the second carrier is different from the first carrier and the second set of impedances comprises a self-impedance of the observation I/O port and mutual impedances of the observation I/O port with respect to other I/O ports;

comparing the first set of impedances to the second set of impedances; and

adjusting the impedance of the first or the second carrier according to the comparison result.

2. The impedance design method as claimed in claim 1, wherein the first carrier comprises the package of the chipset and the second carrier is the wirebond of the chipset.

3. The impedance design method as claimed in claim 1, wherein the first carrier is a PCB trace coupling the voltage source to the chipset and the second carrier is the package or the wirebond of the chipset.