SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
First Claim
1. A semiconductor device comprising:
- an oxide semiconductor film comprising;
a first region;
a pair of second regions, the first region located between the pair of second regions; and
a pair of third regions, the first region and the pair of second regions located between the pair of third regions;
a gate insulating film over the oxide semiconductor film; and
a first electrode over the gate insulating film and overlapping with the first region,wherein the first region is a c-axis aligned crystalline oxide semiconductor region,wherein each of the pair of second regions and the pair of third regions is an amorphous oxide semiconductor region comprising a dopant, andwherein a dopant concentration of the pair of third regions is higher than a dopant concentration of the pair of second regions.
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Accused Products
Abstract
A semiconductor device in which fluctuation in electric characteristics due to miniaturization is less likely to be caused is provided. The semiconductor device includes an oxide semiconductor film including a first region, a pair of second regions in contact with side surfaces of the first region, and a pair of third regions in contact with side surfaces of the pair of second regions; a gate insulating film provided over the oxide semiconductor film; and a first electrode that is over the gate insulating film and overlaps with the first region. The first region is a CAAC oxide semiconductor region. The pair of second regions and the pair of third regions are each an amorphous oxide semiconductor region containing a dopant. The dopant concentration of the pair of third regions is higher than the dopant concentration of the pair of second regions.
106 Citations
32 Claims
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1. A semiconductor device comprising:
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an oxide semiconductor film comprising; a first region; a pair of second regions, the first region located between the pair of second regions; and a pair of third regions, the first region and the pair of second regions located between the pair of third regions; a gate insulating film over the oxide semiconductor film; and a first electrode over the gate insulating film and overlapping with the first region, wherein the first region is a c-axis aligned crystalline oxide semiconductor region, wherein each of the pair of second regions and the pair of third regions is an amorphous oxide semiconductor region comprising a dopant, and wherein a dopant concentration of the pair of third regions is higher than a dopant concentration of the pair of second regions. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A semiconductor device comprising:
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an oxide semiconductor film comprising; a first region; a pair of second regions, the first region located between the pair of second regions; and a pair of third regions, the first region and the pair of second regions located between the pair of third regions; a gate insulating film over the oxide semiconductor film; a first electrode over the gate insulating film and overlapping with the first region; and a first sidewall insulating film and a second sidewall insulating film located on side surfaces of the first electrode, wherein the first sidewall insulating film overlaps with one of the pair of second regions, and the second sidewall insulating film overlaps with the other of the pair of second regions, wherein the first region is a c-axis aligned crystalline oxide semiconductor region, wherein each of the pair of second regions and the pair of third regions is an amorphous oxide semiconductor region comprising a dopant, and wherein a dopant concentration of the pair of third regions is higher than a dopant concentration of the pair of second regions. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A method for manufacturing a semiconductor device comprising the steps of:
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forming an oxide semiconductor film over a substrate during heat treatment to the substrate; forming a gate insulating film over the oxide semiconductor film; forming a first electrode over the gate insulating film; forming a first sidewall insulating film and a second sidewall insulating film on side surfaces of the first electrode; and adding a dopant to the oxide semiconductor film to form a first region, a pair of second regions and a pair of third regions of the oxide semiconductor film, wherein the first electrode overlaps with the first region, wherein the first sidewall insulating film overlaps with one of the pair of second regions, and the second sidewall insulating film overlaps with the other of the pair of second regions, wherein the first region and the pair of second regions are located between the pair of third regions, wherein the first region is a c-axis aligned crystalline oxide semiconductor region, wherein each of the pair of second regions and the pair of third regions is an amorphous oxide semiconductor region comprising the dopant, and wherein a dopant concentration of the pair of third regions is higher than a dopant concentration of the pair of second regions. - View Dependent Claims (21, 22, 23, 24, 25)
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26. A method for manufacturing a semiconductor device comprising the steps of:
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forming a first oxide semiconductor film over a substrate; performing first heat treatment to form a first crystalline oxide semiconductor film after forming the first oxide semiconductor film; forming a second oxide semiconductor film over the first crystalline oxide semiconductor film; performing second heart treatment to form a second crystalline oxide semiconductor film after forming the second oxide semiconductor film; forming a gate insulating film over an oxide semiconductor film that comprises the first crystalline oxide semiconductor film and the second crystalline oxide semiconductor film; forming a first electrode over the gate insulating film; forming a first sidewall insulating film and a second sidewall insulating film on side surfaces of the first electrode; and adding a dopant to the oxide semiconductor film to form a first region, a pair of second regions and a pair of third regions of the oxide semiconductor film, wherein the first electrode overlaps with the first region, wherein the first sidewall insulating film overlaps with one of the pair of second regions, and the second sidewall insulating film overlaps with the other of the pair of second regions, wherein the first region and the pair of second regions are located between the pair of third regions, wherein the first region is a c-axis aligned crystalline oxide semiconductor region, wherein each of the pair of second regions and the pair of third regions is an amorphous oxide semiconductor region comprising the dopant, and wherein a dopant concentration of the pair of third regions is higher than a dopant concentration of the pair of second regions. - View Dependent Claims (27, 28, 29, 30, 31)
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32. A semiconductor device comprising:
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an oxide semiconductor film comprising; a first region; a pair of second regions, the first region located between the pair of second regions; and a pair of third regions, the first region and the pair of second regions located between the pair of third regions; a gate insulating film over the oxide semiconductor film; and a first electrode over the gate insulating film and overlapping with the first region, wherein the first region comprises crystals of which a c-axis is substantially aligned in a direction perpendicular to a surface of the first region, wherein each of the pair of second regions and the pair of third regions is an amorphous oxide semiconductor region comprising a dopant, and wherein a dopant concentration of the pair of third regions is higher than a dopant concentration of the pair of second regions.
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Specification