SAMPLING

• US 20120176179A1
• Filed: 12/06/2011
• Published: 07/12/2012
• Est. Priority Date: 12/08/2010
• Status: Abandoned Application

• Current Assignee: Socionext Inc.
• Original Assignee: Fujitsu Semiconductor Limited (Fujitsu Limited)
• Inventors: Harders, Christian, Fronauer, Wolf, Cheng, Shaoyun, Vogel, Markus, Fischer, Dirk
• Application Number:
  US13/312,668
• Publication Number:
  US 20120176179A1
• Time in Patent Office: Days
• US Class Current: 327/517
• CPC Class Codes: G06F 3/04166 Details of scanning methods, e.g. sampling time, grouping of sub areas or time sharing with display driving Synchronisation with the driving of the display or the backlighting unit to avoid interferences generated internally G06F3/04184
• CPC Class Codes: G06F 3/044 by capacitive means
• CPC Class Codes: H03K 17/962 Capacitive touch switches
• CPC Class Codes: H03K 17/9622 using a plurality of detectors, e.g. keyboard
• CPC Class Codes: H03K 2217/960705 Safety of capacitive touch and proximity switches, e.g. increasing reliability, fail-safe
• CPC Class Codes: H03K 2217/960715 Rc-timing; e.g. measurement of variation of charge time or discharge time of the sensor

Abstract

Integrated circuitry, comprising: a sampling terminal for connecting the integrated circuitry to an external capacitance; sampling means operatively connected to the terminal to take samples, each sample having a sample value; and control means configured, whilst said external capacitance is connected to the sampling terminal, to: internally connect the sampling terminal, or another terminal of the integrated circuitry to which the external capacitance is also connected, to a given voltage-potential source to effect a change in charge stored on the external capacitance, the given voltage-potential source being available within the integrated circuitry when it is in use; cause the sampling means to take a plurality of samples over a period whilst that external capacitance charges or discharges following and/or during said change in charge; and judge whether an event has occurred in dependence upon the plurality of samples.

Claims

1. Integrated circuitry, comprising:

a sampling terminal for connecting the integrated circuitry to an external capacitance;

sampling means operatively connected to the terminal to take samples, each sample having a sample value; and

control means configured, whilst said external capacitance is connected to the sampling terminal, to;

internally connect the sampling terminal, or another terminal of the integrated circuitry to which the external capacitance is also connected, to a given voltage-potential source to effect a change in charge stored on the external capacitance, the given voltage-potential source being available within the integrated circuitry when it is in use;

cause the sampling means to take a plurality of samples over a period whilst that external capacitance charges or discharges following and/or during said change in charge; and

judge whether an event has occurred in dependence upon the plurality of samples.

2. Integrated circuitry as claimed in claim 1, wherein the control means is configured, when said external capacitance is connected to the sampling terminal, to, in a first phase, connect the sampling terminal to said given voltage-potential source and, in a second phase following said first phase, disconnect the sampling terminal from the given voltage-potential source and to cause said samples to be taken.

3. Integrated circuitry as claimed in claim 1, wherein:

said other terminal of the integrated circuitry is a signalling terminal;

the control means is configured to carry out a signalling process and a sampling process when said external capacitance is connected between the sampling terminal and the signalling terminal; and

the control means is configured, in the signalling process, to connect the signalling terminal to said given voltage-potential source as a signal and, in the sampling process, to cause said samples to be taken so as to detect said signal.

4. Integrated circuitry as claimed in claim 1, wherein the sampling means comprises a sampler resistance and a sampler capacitance arranged such that, when the sampling means is taking a sample and the external capacitance is present at the sampling terminal, charge stored on the external capacitance is permitted to transfer to the sampler capacitance via the sampler resistance.

5. Integrated circuitry as claimed in claim 4, configured such that, between taking successive said samples of the plurality of samples, the sampler capacitance is passively at least partly discharged by way of parasitic and/or leakage currents within the sampling circuitry, and/or actively at least partly discharged by connecting it to a given voltage-potential source such as a ground source.

6. Integrated circuitry as claimed in claim 1, configured, after taking a sample of said plurality of samples, to automatically take the next said sample of the plurality of samples, such that said samples are taken in a burst process.

7. Integrated circuitry as claimed in claim 1, wherein the control means is configured to combine the sample values of the plurality of samples to generate a sampling result, and to judge whether the event has occurred in dependence upon the sampling result.

8. Integrated circuitry as claimed claim 7, configured to obtain a series of said sampling results over time, each from a corresponding said plurality of sample values obtained over a corresponding period whilst the external capacitance charges or discharges, wherein the control means is configured to judge whether the event has occurred in dependence upon the series of sampling results.

9. Integrated circuitry as claimed in claim 8, comprising a filter configured to filter a signal formed from said sampling results to obtain a filtered signal.

10. Integrated circuitry as claimed in claim 1, wherein the control means is operable to detect a fault in said sampling circuitry based upon said sampling values and/or sampling results and corresponding information indicative of a fault condition.

11. Integrated circuitry as claimed in claim 1, comprising a plurality of said sampling terminals, wherein the control means is operable to cause a plurality of samples to be taken for each said sampling terminal.

12. Integrated circuitry as claimed in claim 11, wherein the control means is configured, in synchronisation with the said first phase for a particular one of those terminals, to connect the other said terminals to said given voltage-potential source and, in synchronisation with the said second phase for the particular terminal, to disconnect the other said terminals from the given voltage-potential source and to connect them to another voltage-potential source configured to have an opposite effect on the external capacitances of those other terminals to the effect had on them during the first phase of the particular said terminal.

13. A microcontroller comprising integrated circuitry as claimed in claim 1.

14. Apparatus for capacitive touch sensing, comprising:

integrated circuitry or a microcontroller as claimed in claim 1; and

a capacitance connected to the sampling terminal as said external capacitance and configured to be touchable by a user of the apparatus.

16. Integrated circuitry as claimed in claim 2, wherein:

said other terminal of the integrated circuitry is a signalling terminal;

the control means is configured to carry out a signalling process and a sampling process when said external capacitance is connected between the sampling terminal and the signalling terminal; and

the control means is configured, in the signalling process, to connect the signalling terminal to said given voltage-potential source as a signal and, in the sampling process, to cause said samples to be taken so as to detect said signal.

15. A computer program which, when executed on integrated circuitry comprising a sampling terminal for connecting the integrated circuitry to an external capacitance and sampling means operatively connected to the terminal to take samples each having a sample value, causes the integrated circuitry, whilst said external capacitance is connected to the sampling terminal, to:

internally connect the sampling terminal, or another terminal of the integrated circuitry to which the external capacitance is also connected, to a given voltage-potential source to effect a change in charge stored on the external capacitance, the given voltage-potential source being available within the integrated circuitry when it is in use;

cause the sampling means to take a plurality of samples over a period whilst that external capacitance charges or discharges following and/or during said change in charge; and

judge whether an event has occurred in dependence upon the plurality of samples.

17. Integrated circuitry, comprising:

a sampling terminal for connecting the integrated circuitry to an external capacitance;

sampler operatively connected to the terminal to take samples, each sample having a sample value; and

controller configured, whilst said external capacitance is connected to the sampling terminal, to;

internally connect the sampling terminal, or another terminal of the integrated circuitry to which the external capacitance is also connected, to a given voltage-potential source to effect a change in charge stored on the external capacitance, the given voltage-potential source being available within the integrated circuitry when it is in use;

cause the sampler to take a plurality of samples over a period whilst that external capacitance charges or discharges following and/or during said change in charge; and

judge whether an event has occurred in dependence upon the plurality of samples.