METHOD AND APPARATUS FOR EXAMINING AN OBJECT USING ELECTROMAGNETIC MILLIMETER-WAVE SIGNAL ILLUMINATION

• US 20120176265A1
• Filed: 01/06/2011
• Published: 07/12/2012
• Est. Priority Date: 01/06/2011
• Status: Active Grant

• Current Assignee: The Boeing Co.
• Original Assignee: The Boeing Co.
• Inventors: Smith, Robert A.
• Granted Patent: US 8,319,682 B2
• Time in Patent Office: Days
• US Class Current: 342/22
• CPC Class Codes: G01V 8/005 operating with millimetre waves, e.g. measuring the black losey radiation

Abstract

A method examining an object using millimeter-wave signals includes: (a) providing at least two millimeter-wave signal sources; (b) transmitting at least two millimeter-wave signals having at least two different frequencies from the signal sources illuminate the object; (c) in no particular order: (1) determining whether a return reflected signal is above a threshold level; [a] if yes, processing the return signal to identify object shape; [b] if not, processing another return signal; and (2) determining whether a return intermodulation product or harmonic signal is detected; [a] if yes, processing the return signal to identify object nature; [b] if not, processing another return signal; (d) determining whether checked all return signals; (1) if not, processing another return signal; (2) if yes, proceeding to step (e); (e) determining whether results are satisfactory; (1) if not, changing frequency of at least one of the wave signals; (2) if yes, terminating the method.

Claims

1. A method for examining an object using electromagnetic millimeter-wave signal illumination;

the method comprising;

(a) providing at least two electromagnetic millimeter-wave signal sources;

(b) transmitting at least two electromagnetic millimeter-wave signals from said at least two electromagnetic millimeter-wave signal sources to illuminate said object;

said at least two electromagnetic millimeter-wave signals having at least two different frequencies;

(c) in no particular order;

(1) determining whether a return reflected signal from said object is above a predetermined threshold signal level;

[a] if said return reflected signal is above said predetermined threshold signal level, processing said return reflected signal to identify shape of said object;

[b] if said return reflected signal is not above said predetermined threshold signal level;

processing another return signal; and

(2) determining whether a return intermodulation product or harmonic signal from said object is detected;

[a] if said return intermodulation product or harmonic signal is detected, processing said return intermodulation product or harmonic signal to identify nature of said object;

[b] if said return intermodulation product or harmonic signal is not detected;

processing another return signal;

(d) determining whether all return signals have been checked;

(1) if all return signals have not been checked, processing another return signal;

(2) if all return signals have been checked, proceeding to step (e);

(e) determining whether the method has yielded satisfactory results;

(1) if the method has not yielded satisfactory results, changing frequency of at least one of said at least two electromagnetic millimeter-wave signals and repeating steps (b) through (e);

(2) if the method has yielded satisfactory results, terminating the method.

2. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 1 wherein the method further comprises:

replacing step (e)(1) with;

if the method has not yielded satisfactory results, posing a query whether another aspect of said object is desired.

[a] if another aspect of the object is desired, changing aspect to the object by effecting at least one of;

[1] scanning said at least two electromagnetic millimeter-wave signals to a different aspect angle to said object;

[2] moving said object to present a different aspect to said at least two electromagnetic millimeter-wave signal sources; and

[3] repeating steps (b) through (e); and

[b] if another aspect of said object is not desired, changing frequency of at least one of said at least two electromagnetic millimeter-wave signals and repeating steps (b) through (e).

3. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 1 wherein said object is comprised of a plurality of object-units located substantially at a single locus.

4. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 2 wherein said object is comprised of a plurality of object-units located substantially at a single locus.

5. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 2 wherein said scanning is effected substantially by mechanical relocation of said at least two electromagnetic millimeter-wave signal sources with respect to said object.

6. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 2 wherein said scanning is carried out substantially by electronic signal steering to effect reorientation of said at least two electromagnetic millimeter-wave signals with respect to said object.

7. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 3 wherein said scanning is effected substantially by mechanical relocation of said at least two electromagnetic millimeter-wave signal sources with respect to said object.

8. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 3 wherein said scanning is carried out substantially by electronic signal steering to effect reorientation of said at least two electromagnetic millimeter-wave signals with respect to said object.

9. A method for examining an object using electromagnetic millimeter-wave signal illumination;

the method comprising;

(a) providing at least two electromagnetic millimeter-wave signal sources;

(b) transmitting at least two electromagnetic millimeter-wave signals from said at least two electromagnetic millimeter-wave signal sources to illuminate said object;

said at least two electromagnetic millimeter-wave signals having at least two different frequencies;

(c) substantially simultaneously;

(1) determining whether a return reflected signal from said object is above a predetermined threshold signal level;

[a] if said return reflected signal is above said predetermined threshold signal level, processing said return reflected signal to identify shape of said object;

[b] if said return reflected signal is not above said predetermined threshold signal level;

processing another return signal; and

(2) determining whether a return intermodulation product or harmonic signal from said object is detected;

[a] if said return intermodulation product or harmonic signal is detected, processing said return intermodulation product or harmonic signal to identify nature of said object;

[b] if said return intermodulation product or harmonic signal is not detected;

processing another return signal;

(e) determining whether all return signals have been checked;

(1) if all return signals have not been checked, processing another return signal;

(2) if all return signals have been checked, proceeding to step (f);

(f) determining whether the method has yielded satisfactory results;

(1) if the method has not yielded satisfactory results, changing frequency of at least one of said at least two electromagnetic millimeter-wave signals and repeating steps (b) through (f);

(2) if the method has yielded satisfactory results, terminating the method.

10. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 9 wherein the method further comprises:

replacing step (f)(1) with;

if the method has not yielded satisfactory results, posing a query whether another aspect of said object is desired.

[a] if another aspect of the object is desired, changing aspect to the object by effecting at least one of;

[1] scanning said at least two electromagnetic millimeter-wave signals to a different aspect angle to said object;

[2] moving said object to present a different aspect to said at least two electromagnetic millimeter-wave signal sources; and

[3] repeating steps (b) through (f); and

[b] if another aspect of said object is not desired, changing frequency of at least one of said at least two electromagnetic millimeter-wave signals and repeating steps (b) through (f).

11. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 9 wherein said object is comprised of a plurality of object-units located substantially at a single locus.

12. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 10 wherein said object is comprised of a plurality of object-units located substantially at a single locus.

13. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 10 wherein said scanning is effected substantially by mechanical relocation of said at least two electromagnetic millimeter-wave signal sources with respect to said object.

14. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 10 wherein said scanning is carried out substantially by electronic signal steering to effect reorientation of said at least two electromagnetic millimeter-wave signals with respect to said object.

15. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 11 wherein said scanning is effected substantially by mechanical relocation of said at least two electromagnetic millimeter-wave signal sources with respect to said object.

16. The method for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 11 wherein said scanning is carried out substantially by electronic signal steering to effect reorientation of said at least two electromagnetic millimeter-wave signals with respect to said object.

17. An apparatus for examining an object using electromagnetic millimeter-wave signal illumination;

the apparatus comprising;

(a) at least two electromagnetic millimeter-wave signal sources;

said at least two electromagnetic millimeter-wave signal sources being oriented with respect to said object to permit illumination of said object by at least two electromagnetic millimeter-wave signals from said at least two electromagnetic millimeter-wave signal sources;

said at least two electromagnetic millimeter-wave signals having at least two different frequencies;

(b) at least one receiver unit oriented with respect to said object to permit receiving reflected signals of selected electromagnetic millimeter-wave signals of said at least two electromagnetic millimeter-wave signals;

(c) an analysis unit coupled with said at least one receiver unit;

said analysis unit ascertaining signal level of said reflected signals and intermodulation product or harmonic signals among said reflected signals;

said at least one receiver unit and said analysis unit cooperating to indicate shape of said object when said reflected signals are above a predetermined threshold signal level;

said at least one receiver unit and said analysis unit cooperating to indicate nature of said object by said intermodulation product or harmonic signals.

18. The apparatus for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 17 wherein at least one of said object and said at least two electromagnetic millimeter-wave signal sources is configured for reorientation to present a different aspect of said object to said at least two electromagnetic millimeter-wave signal sources.

19. The apparatus for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 18 wherein said reorientation by said at least two electromagnetic millimeter-wave signal sources is carried out by physically moving at least one of said at least two electromagnetic millimeter-wave signal sources to effect scanning of said object by selected of said at least two electromagnetic millimeter-wave signals.

20. The apparatus for examining an object using electromagnetic millimeter-wave signal illumination as recited in claim 18 wherein said reorientation by said at least two electromagnetic millimeter-wave signal sources is carried out by electronic signal steering of at least one of said at least two electromagnetic millimeter-wave signal sources to effect scanning of said object by selected of said at least two electromagnetic millimeter-wave signals.