METHOD FOR INFORMATION TRANSFER IN A VOLTAGE-DRIVEN INTELLIGENT CHARACTERIZATION BENCH FOR SEMICONDUCTOR
First Claim
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1. A method for transmitting test parameters to a plurality of test device comprising the steps of:
- identifying a test device to provide test parameters;
checking to see if the test device is ready to receive the test parameters;
sending the test parameters;
providing a flag when the data is loaded.
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Abstract
A method for transmitting data from test device to a storage device via a parallel bus. The methods comprising the steps of setting a flag to indicate that data is available, reading the data, setting a flag to indicate the data was read. In addition test parameters are sent to the test device from the storage device, the method comprises the steps of checking to see if a test device is ready to receive data, transferring the test parameters, identifying the next channel to update.
18 Citations
14 Claims
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1. A method for transmitting test parameters to a plurality of test device comprising the steps of:
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identifying a test device to provide test parameters; checking to see if the test device is ready to receive the test parameters; sending the test parameters; providing a flag when the data is loaded. - View Dependent Claims (2, 3, 4)
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5. A method for providing data from a plurality of test device to a storage device, comprising the steps of:
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entering test data into a buffer; setting a flag to indicate data is available; and setting an interrupt to indicate the data has been read by a storage device. - View Dependent Claims (6, 7)
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8. A method for providing data from a plurality of test device to a storage device, comprising the steps of:
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loading the test data into a buffer; loading a unit of data into a transfer buffer; setting a flag to indicate a unit of data is loaded into a buffer, and determining if a storage device has set a flag to indicate it read the unit of data. - View Dependent Claims (9, 10)
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11. A method for providing data from a plurality of driver channels to a storage device, comprising the steps of:
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setting i to equal 1; determining if i is greater that the number of DUTs being tested; transferring data from the ith test device to the driver channel; and incrementing i by one. - View Dependent Claims (12, 13, 14)
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Specification