OPTIMIZED AUTOMATED TEST EQUIPMENT MULTI-PATH RECEIVER CONCEPT
First Claim
1. A multi-path receiver for an automated test equipment, the multi-path receiver comprising:
- an input for receiving low-power signals and high-power signals, the high-power signals having a signal amplitude higher than the low-power signals;
an output for outputting a received signal;
a first path for transmitting a received high-power signal from the input to the output;
a second path for transmitting a received low-power signal from the input to the output, the second path comprising an amplifier;
a first switch for switching a received high-power signal to the first path and for switching a received low-power signal to the second path; and
a high-power amplifier coupled between the input and the first switch for amplifying the received signal independent of its input power before it is switched to the first or second path.
4 Assignments
0 Petitions
Accused Products
Abstract
A multi-path receiver for automated test equipment. The multi-path receiver includes an input for receiving low-power signals and high-power signals. The high-power signals have signal amplitude higher than the low-power signals. The multi-path receiver further comprises an output for outputting a received signal, a first path for transmitting a received high-power signal from the input to the output and a second path for transmitting a received low-power signal from the input to the output. The second path comprises an amplifier. A first switch is provided for switching a received high-power signal to the first path and for switching a received low-power signal to the second path. A high-power amplifier is also connected between the input and the first switch for amplifying the received signal independent of its input power before it is switched with the first path or the second path.
-
Citations
21 Claims
-
1. A multi-path receiver for an automated test equipment, the multi-path receiver comprising:
-
an input for receiving low-power signals and high-power signals, the high-power signals having a signal amplitude higher than the low-power signals; an output for outputting a received signal; a first path for transmitting a received high-power signal from the input to the output; a second path for transmitting a received low-power signal from the input to the output, the second path comprising an amplifier; a first switch for switching a received high-power signal to the first path and for switching a received low-power signal to the second path; and a high-power amplifier coupled between the input and the first switch for amplifying the received signal independent of its input power before it is switched to the first or second path. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
-
9. An automated test equipment comprising a plurality of test pins for testing a device-under-test, each of the test pins being coupled to an input of a multipath-receiver, the multi-path receiver comprising:
-
an input for receiving low-power signals as well as high-power signals, the high-power signals having a signal amplitude higher than the low-power signals; an output for outputting a received signal; a first path for transmitting a received high-power signal from the input to the output; a second path for transmitting a received low-power signal from the input to the output, the second path comprising an amplifier; a first switch for switching a received high-power signal to the first path and for switching a received low-power signal to the second path; and a high-power amplifier coupled between the input and the first switch for amplifying the received signal independent of its input power before it is switched to the first or second path. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
-
-
17. A method for testing a mixed-signal integrated circuit, the method comprising:
-
accessing an analog test signal from the mixed-signal integrated circuit; amplifying the received test signal independently of its input power with a high-power amplifier to obtain an amplified test signal; and switching the amplified test signal to one of a high-power signal path in case of a high-power test signal and a low-power signal path in case of a low-power test signal. - View Dependent Claims (18, 19, 20, 21)
-
Specification