BACKGROUND NOISE MEASUREMENT AND FREQUENCY SELECTION IN TOUCH PANEL SENSOR SYSTEMS
First Claim
1. A system comprising:
- a sensor configured to detect a change in capacitance associated with a touch upon a touch panel;
a drive module coupled to the sensor, the drive module configured to generate a first drive signal having a first waveform characteristic during a first phase and a second drive signal having a second waveform characteristic different from the first waveform characteristic during a second phase; and
a measuring module coupled to the sensor, the measuring module configured to measure noise having the first waveform characteristic during the second phase.
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Accused Products
Abstract
A touch panel sensor system that can dynamically measure noise and automatically switch to a frequency with minimal noise is described. The touch panel sensor system includes a sensor configured to detect a change in capacitance associated with a touch upon a touch panel. The system also includes a drive module configured to generate a drive signal having a first waveform characteristic (e.g., signal having a periodic waveform characteristic) during a first phase (e.g., sensor phase) and a second drive signal having a second waveform characteristic (e.g., constant voltage signal) during a second phase (e.g., noise detection phase). The first and second drive signals are configured to drive the sensor. The system also includes a measuring module coupled to the sensor that is configured to measure noise having the first waveform characteristic (e.g., periodic waveform characteristic) during the second phase.
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Citations
20 Claims
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1. A system comprising:
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a sensor configured to detect a change in capacitance associated with a touch upon a touch panel; a drive module coupled to the sensor, the drive module configured to generate a first drive signal having a first waveform characteristic during a first phase and a second drive signal having a second waveform characteristic different from the first waveform characteristic during a second phase; and a measuring module coupled to the sensor, the measuring module configured to measure noise having the first waveform characteristic during the second phase. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system comprising:
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a sensor configured to detect a change in capacitance associated with a touch upon a touch panel; a drive module coupled to the sensor, the drive module configured to generate a first drive signal having a first waveform characteristic during a first phase and a second drive signal having a second waveform characteristic different from the first waveform characteristic during a second phase, the first drive signal and the second drive signal for driving the sensor; an offset cancellation module coupled to the sensor, the offset cancellation module configured to furnish an adjustable capacitive value for the sensor; an offset cancellation drive module coupled to the offset cancellation module, the offset cancellation drive module configured to generate a first offset cancellation drive signal having the first waveform characteristic during the first phase and a second offset cancellation drive signal having the second waveform characteristic during the second phase, the first offset cancellation drive signal and the second offset cancellation drive signal for driving the offset cancellation module; and a measuring module coupled to the sensor and the offset cancellation module, the measuring module configured to detect noise having the first waveform characteristic during the second phase, the noise associated with at least one of the sensor or the offset cancellation module. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A method comprising:
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initiating a first noise measurement comprising a first waveform characteristic at a measuring module, the first noise measurement associated with a sensor configured to detect a change in capacitance associated with a touch upon a touch panel; determining whether the first noise measurement exceeds a predetermined threshold; and initiating a second noise measurement comprising a second waveform characteristic when the first noise measurement exceeds the predetermined threshold, the second waveform characteristic different from the first waveform characteristic, the second noise measurement associated with the sensor. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification