INTELLIGENT AIRFOIL COMPONENT GRAIN DEFECT INSPECTION

• US 20120232841A1
• Filed: 03/09/2012
• Published: 09/13/2012
• Est. Priority Date: 03/09/2011
• Status: Active Grant

• Current Assignee: Rolls-Royce Corporation (Rolls-Royce Holdings Plc)
• Original Assignee: Rolls-Royce Corporation (Rolls-Royce Holdings Plc)
• Inventors: Kush, Matthew, Ma, Kong, Moriarty, Robert
• Granted Patent: US 9,046,497 B2
• Time in Patent Office: Days
• US Class Current: 702/167
• CPC Class Codes: G01N 2021/8887 based on image processing techniques
• CPC Class Codes: G01N 21/8851 Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002
• CPC Class Codes: G01N 23/00 Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00

Abstract

A system including a positioning system with a component manipulator structured to position a component in response to a positioning algorithm; a scanning system capable of producing a set of light waves directed at a surface of the component, detecting a set of reflected light waves from the surface of the component, and producing a reflectivity data set in response to the set of reflected light waves; and a microprocessor structured to apply a fuzzy logic algorithm to the reflectivity signal to determine a solution set and produce a grain structure characterization in response to the solution set.

Claims

1. A system comprising:

a component manipulator structured to position a component in response to a positioning algorithm;

a surface scanner capable of

producing an electromagnetic radiation directed at a surface of the component,

detecting the electromagnetic radiation from the surface of the component, and

producing a reflectivity signal in response to the detecting; and

a processor structured to;

apply a fuzzy logic algorithm to the reflectivity signal and determine a solution set in response to the reflectivity signal; and

produce a grain structure characterization in response to the solution set.

2. The system of claim 1, wherein the grain structure characterization further includes a pass/fail signal, and wherein the electromagnetic radiation is a visible or near-visible light.

3. The system of claim 1, wherein the grain structure characterization further includes a characterization report.

4. The system of claim 1, wherein the grain structure characterization further includes a grain structure selected from a group consisting of:

grain structure, grain defects, grain locations, grain size, grain defect density and combinations thereof.

6. The method of claim 4, wherein the fuzzy logic analysis includes an input collecting module, a processing module, a compiling module, and an output producing module.

7. The method of claim 6, wherein the input collecting module includes collecting the reflectivity data set.

8. The method of claim 6, wherein the output producing module includes producing the solution data set.

5. A method comprising:

applying a positioning algorithm to manipulate at least one piece of positioning equipment in response to a component;

analyzing a surface of the component with a light source and a reflectivity detection unit;

producing a reflectivity data set in response to analyzing the surface of the component;

applying a fuzzy logic analysis to the reflectivity data set wherein the fuzzy logic analysis is capable of producing a solution data set; and

providing a grain structure characterization in response to the solution data set.

9. The method of claim 5, wherein the at least one piece of positioning equipment further includes a robotic manipulator capable of positioning the component in response to the component and the positioning algorithm.

10. The method of claim 5, wherein the grain structure characterization further includes indicating a grain structure selected from a group consisting of grain structure, grain defects, grain locations, grain size, grain defect density and combinations thereof.

11. The method of claim 10, wherein the grain structure characterization further includes a pass/fail signal.

12. The method of claim 10, wherein the grain structure characterization further includes a characterization report.

13. An apparatus comprising:

a position module structured to position a component;

a reflection module structured to provide

a light source directed to a surface of the component,

a detection unit to detect a quantity of reflected light from the surface of the component, and

a reflectivity data set in response to the quantity of reflected light;

a grain structure characterization module utilizing a fuzzy logic algorithm capable of;

applying the reflectivity data set as a set of input variables;

assigning a degree of intensity to the set of input variables;

determining an output data set; and

converting the output data set to a set of solutions; and

an indication module structured to provide at least one indication of a grain structure in response to the set of solutions.

14. The apparatus of claim 13, wherein providing the at least one indication further includes providing a characterization of at least one grain defect.

15. The apparatus of claim 13, wherein the at least one indication further includes a grain structure selected from a group consisting of:

grain structure, grain defects, grain locations, grain size, grain defect density and combinations thereof.

16. The apparatus of claim 13, wherein the at least one indication further includes a grain structure characterization in response to the set of solutions and a cognitive characterization process utilizing an airfoil defect knowledge bank.

17. The apparatus of claim 13, wherein the position module is further structured to include a component manipulator wherein the component manipulator positions the component in response to a positioning algorithm.

18. The apparatus of claim 17, wherein the component manipulator utilizes an imaging system to identify a component type of the component and determines the positioning algorithm in response to the component type.

19. The apparatus of claim 17, wherein the positioning algorithm further includes identifying the component in response to the reflectivity data set and a component orientation database.

20. The apparatus of claim 13, wherein the component further includes a single crystal cast airfoil-type component.