METHOD AND SYSTEM TO COMPENSATE FOR TEMPERATURE AND PRESSURE IN PIEZO RESISTIVE DEVICES
First Claim
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1. A method of calibrating a piezo resistive device, comprising:
- providing a piezo resistive element having a fluctuating resistivity in the piezo resistive device;
receiving signals representative of the temperature and pressure readings of the piezo resistive device;
calculating a first temperature as a function of the signal representative of temperature reading of the piezo resistive device; and
calculating an actual pressure as a function of the first temperature and the signal representative of pressure reading of the piezo resistive device.
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Abstract
A method and system to calibrate temperature and pressure in piezo resistive devices for non-linear sensors having two variables, where a piezo resistive device such as a piezo resistive transducer (PRT) used for example in a pressure sensor system is calibrated to calculate actual/ambient temperature and pressure even though the PRT impedance is unbalanced relative to pressure.
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Citations
20 Claims
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1. A method of calibrating a piezo resistive device, comprising:
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providing a piezo resistive element having a fluctuating resistivity in the piezo resistive device; receiving signals representative of the temperature and pressure readings of the piezo resistive device; calculating a first temperature as a function of the signal representative of temperature reading of the piezo resistive device; and calculating an actual pressure as a function of the first temperature and the signal representative of pressure reading of the piezo resistive device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system of calibrating a piezo resistive device, comprising:
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a piezo resistive element having a fluctuating resistivity in the piezo resistive device; and a processor for receiving signals representative of the temperature and pressure readings of the piezo resistive device;
calculating a first temperature as a function of the signal representative of temperature reading of the piezo resistive device; and
calculating an actual pressure as a function of the first temperature and the signal representative of pressure reading of the piezo resistive device. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification