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OPTICAL INSPECTION APPARATUS AND METHOD

  • US 20120274758A1
  • Filed: 07/15/2011
  • Published: 11/01/2012
  • Est. Priority Date: 04/28/2011
  • Status: Active Grant
First Claim
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1. An optical inspection apparatus for simultaneously scanning the profile of at least two adjacent surfaces of an article moving along a travel path axis passing through an inspection area located at a central plane transverse to said travel path axis, the apparatus comprising:

  • a first profile sensor unit having a first optical sensing field directed toward said travel path axis and defining a first scanning zone associated with a first one of said adjacent surfaces as intersected by said first sensing field, and a first laser source directing at angle with said first sensing field a first fan-shaped laser beam toward the first scanning zone to define an associated first scanning plane transverse to said travel path axis, to generate first sensor output data related to the profile of said first article surface; and

    a second profile sensor unit having a second optical sensing field directed toward said travel path axis and defining a second scanning zone associated with a second one of said adjacent surfaces as intersected by said second sensing field, and a second laser source directing at angle with said second sensing field a second fan-shaped laser beam toward the second scanning zone to define an associated second scanning plane transverse to said travel path axis, to generate second sensor output data related to the profile of said second article surface;

    wherein the first and second profile sensor units are disposed one with respect to another so that;

    their respective first and second scanning zones are sufficiently spaced one with another along said travel path axis to substantially prevent mutual scanning interference between said first and second profile sensor units; and

    one of said first sensing field and said first laser beam is crossing the central plane toward the other one of said first sensing field and said first laser beam, one of said second sensing field and said second laser beam is crossing the central plane toward the other one of said second sensing field and said second laser beam, to provide a compact arrangement of said first and second profile sensor units.

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