SEMICONDUCTOR DEVICE, MEMORY DEVICE, AND METHOD FOR MANUFACTURING THE SEMICONDUCTOR DEVICE
First Claim
1. A semiconductor device comprising:
- a source electrode and a drain electrode over an insulating surface;
an oxide semiconductor layer over the source electrode and the drain electrode;
a first electrode over one of the source electrode and the drain electrode with the oxide semiconductor layer interposed therebetween;
a gate insulating layer over and in contact with the oxide semiconductor layer and the first electrode; and
a gate electrode over the gate insulating layer so as to overlap with the first electrode.
1 Assignment
0 Petitions
Accused Products
Abstract
An oxide semiconductor is used for a semiconductor layer of a transistor included in a semiconductor device, whereby leakage current between a source and a drain can be reduced, so that reduction in power consumption of a semiconductor device and a memory device including the semiconductor device and an improvement in characteristics of retaining stored data (electric charge) in the semiconductor device and the memory device can be achieved. Further, a drain electrode of the transistor, the semiconductor layer, and a first electrode which overlaps with the drain electrode form a capacitor, and a gate electrode is led to an overlying layer at a position which overlaps with the capacitor. Thus, the semiconductor device and the memory device including the semiconductor device can be miniaturized.
-
Citations
20 Claims
-
1. A semiconductor device comprising:
-
a source electrode and a drain electrode over an insulating surface; an oxide semiconductor layer over the source electrode and the drain electrode; a first electrode over one of the source electrode and the drain electrode with the oxide semiconductor layer interposed therebetween; a gate insulating layer over and in contact with the oxide semiconductor layer and the first electrode; and a gate electrode over the gate insulating layer so as to overlap with the first electrode. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
-
13. A method for manufacturing a semiconductor device comprising the steps of:
-
forming a source electrode and a drain electrode over an insulating surface; forming an oxide semiconductor layer over the source electrode and the drain electrode; forming a first electrode over one of the source electrode and the drain electrode with the oxide semiconductor layer interposed therebetween; forming a gate insulating layer over and in contact with the oxide semiconductor layer and the first electrode; forming a gate electrode over the gate insulating layer so as to overlap with the first electrode; forming an interlayer insulating layer over the gate insulating layer and the gate electrode; and forming a contact hole in the interlayer insulating layer so as to overlap with the first electrode.
-
-
14. A method for manufacturing a semiconductor device comprising the steps of:
-
forming a source electrode and a drain electrode over an insulating surface; forming an oxide semiconductor layer over the source electrode and the drain electrode; forming a first electrode over one of the source electrode and the drain electrode with the oxide semiconductor layer interposed therebetween; forming a gate insulating layer over and in contact with the oxide semiconductor layer and the first electrode; forming a gate electrode over the gate insulating layer so as to overlap with the first electrode; and forming an interlayer insulating layer over the gate insulating layer and the gate electrode, performing a planarization treatment on a surface of the interlayer insulating layer. - View Dependent Claims (15, 16)
-
-
17. A semiconductor device comprising:
-
a gate electrode over an insulating surface; a gate insulating layer adjacent to the gate electrode; an oxide semiconductor layer adjacent to the gate electrode with the gate insulating layer interposed therebetween; a source electrode and a drain electrode in contact with the oxide semiconductor layer; a first electrode provided between the gate insulating layer and the oxide semiconductor layer so as to overlap with one of the source electrode and the drain electrode. - View Dependent Claims (18, 19, 20)
-
Specification