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Measuring Bulk Lifetime

  • US 20120286806A1
  • Filed: 11/09/2011
  • Published: 11/15/2012
  • Est. Priority Date: 01/14/2010
  • Status: Abandoned Application
First Claim
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1. A method comprising:

  • electromagnetically coupling a substrate into an inductance-capacitance resonant circuit formed from (i) a member comprising a ferromagnetic material, (ii) an inductor and (iii) the substrate;

    illuminating the substrate for a first time period X to cause photoconduction in the substrate;

    measuring decay in conductivity of the substrate for a second time period Y, wherein a ratio of X to Y is greater than 1;

    10; and

    determining bulk lifetime of the substrate from the decay.

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