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HVMOS Reliability Evaluation using Bulk Resistances as Indices

  • US 20120293191A1
  • Filed: 05/19/2011
  • Published: 11/22/2012
  • Est. Priority Date: 05/19/2011
  • Status: Active Grant
First Claim
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1. A method comprising:

  • determining a bulk resistance of a high-voltage PMOS (HVPMOS) device; and

    evaluating a reliability of the HVPMOS device based on the bulk resistance.

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