APPARATUS AND METHOD FOR QUANTIFYING BINDING AND DISSOCIATION KINETICS OF MOLECULAR INTERACTIONS
First Claim
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1. An apparatus for quantifying binding and dissociation kinetics of molecular interactions, comprising:
- a micro flow path structure 100, comprising a support 110, a substrate 120 formed on the support 110 and made of a semiconductor or dielectric material, a thin dielectric film 130 formed on the substrate 120, a cover unit 140 configured to have an incident window 142 and a reflection window 144 respectively provided on one side and the other side and disposed on the support 110, and micro flow paths 150 formed in the support 110 and between the support 110 and the cover unit 140;
a sample injection unit 200 for forming a binding layer 160 of samples on the thin dielectric film 130 by injecting a buffer solution 210, comprising the samples of a bio material into the micro flow paths 150;
a polarization generation unit 300 for radiating incident light, polarized through the incident window 142, to the binding layer 160 at an angle of incidence θ
satisfying a p-wave non-reflecting condition; and
a polarization detection unit 400 for detecting a change in a polarization of reflected light of the binding layer 160 which is incident through the reflection window 144.
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Abstract
The present invention relates to an apparatus for quantifying the binding and dissociation kinetics of molecular interactions of small molecular bio materials with high sensitivity almost without the influence of a change in the reflective index resulting from a buffer solution by making polarized incident light incident on the binding layer of a bio material, formed in a thin dielectric film, so that the polarized incident light satisfies a p-wave non-reflecting condition and a quantifying method using the same.
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23 Claims
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1. An apparatus for quantifying binding and dissociation kinetics of molecular interactions, comprising:
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a micro flow path structure 100, comprising a support 110, a substrate 120 formed on the support 110 and made of a semiconductor or dielectric material, a thin dielectric film 130 formed on the substrate 120, a cover unit 140 configured to have an incident window 142 and a reflection window 144 respectively provided on one side and the other side and disposed on the support 110, and micro flow paths 150 formed in the support 110 and between the support 110 and the cover unit 140; a sample injection unit 200 for forming a binding layer 160 of samples on the thin dielectric film 130 by injecting a buffer solution 210, comprising the samples of a bio material into the micro flow paths 150; a polarization generation unit 300 for radiating incident light, polarized through the incident window 142, to the binding layer 160 at an angle of incidence θ
satisfying a p-wave non-reflecting condition; anda polarization detection unit 400 for detecting a change in a polarization of reflected light of the binding layer 160 which is incident through the reflection window 144. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A method of quantifying binding and dissociation kinetics of molecular interactions, the method comprising:
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a first step S100 of a sample injection unit 200 injecting a buffer solution 210, including samples of small molecular bio materials, into micro flow paths 150 of a micro flow path structure 100; a second step S200 of the samples being bound to a thin dielectric film 130 of the micro flow path structure 100, thus forming a binding layer 160; a third step S300 of a polarization generation unit 300 polarizing predetermined light and making the polarized light incident on the binding layer 160 at an angle of incidence to satisfy a p-wave non-reflecting condition through an incident window 142 of the micro flow path structure 100; a fourth step S400 of reflected light of the binding layer 160 being incident on a polarization detection unit 400 through a reflection window 144 of the micro flow path structure 100; and a fifth step S500 of the polarization detection unit 400 detecting a polarization state of the reflected light using an ellipsometry or a reflectometry. - View Dependent Claims (21, 22, 23)
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Specification