×

SEMICONDUCTOR CHIP AND TEST METHOD

  • US 20120297263A1
  • Filed: 05/17/2012
  • Published: 11/22/2012
  • Est. Priority Date: 05/18/2011
  • Status: Active Grant
First Claim
Patent Images

1. A semiconductor chip comprising:

  • a functional block for generating an oscillating output signal to perform a communication function;

    an input circuit for supplying an oscillating test signal to the functional block, thereby causing the functional block to generate the oscillating output signal;

    a test circuit for detecting a first strength, the first strength being a strength of the oscillating output signal generated by the functional block in response to input of the oscillating test signal, and generating a strength signal indicating the first strength; and

    a first external terminal for external output of the strength signal.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×