MULTI-LAYER TIME-INTERLEAVED ANALOG-TO-DIGITAL CONVERTOR (ADC)
First Claim
1. A method, comprising:
- in an electronic device;
sampling in a first level, at a particular main sampling rate, an input RF signal;
sampling in a second level an output of said first level, via a plurality of second-level branches, wherein each of said plurality of second-level branches samples at a second sampling rate that is reduced compared to said main sampling rate; and
processing in a third level, each output of said plurality of second-level branches via a corresponding one of a plurality of third-level branches, wherein each of said plurality of third-level branches comprises a plurality of sub-branches, and each of said plurality of sub-branches;
samples at a third sampling rate that is reduced compared to said second sampling rate; and
applies analog-to-digital conversion (ADC).
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Abstract
A radio frequency (RF) receiver may comprise a first sampling module that is operable to sample in a first level at a particular main sampling rate; a plurality of second-level sampling modules, wherein each of the plurality of second-level sampling modules is operable to sample in a second level, an output of the first level, at a second sampling rate that is reduced compared to the main sampling rate; and a plurality of third-level modules, each comprising a plurality of third-stage sampling sub-modules that are operable to sample at a third sampling rate that is reduced compared to the second sampling rate, and a plurality of corresponding analog-to-digital conversion (ADC) sub-modules.
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Citations
20 Claims
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1. A method, comprising:
in an electronic device; sampling in a first level, at a particular main sampling rate, an input RF signal; sampling in a second level an output of said first level, via a plurality of second-level branches, wherein each of said plurality of second-level branches samples at a second sampling rate that is reduced compared to said main sampling rate; and processing in a third level, each output of said plurality of second-level branches via a corresponding one of a plurality of third-level branches, wherein each of said plurality of third-level branches comprises a plurality of sub-branches, and each of said plurality of sub-branches; samples at a third sampling rate that is reduced compared to said second sampling rate; and applies analog-to-digital conversion (ADC). - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system, comprising:
one or more circuits for use in an electronic device, the one or more circuits being operable to; sample in a first level, at a particular main sampling rate, an input RF signal; sample in a second level an output of said first level, via a plurality of second-level branches, wherein each of said plurality of second-level branches samples at a second sampling rate that is reduced compared to said main sampling rate; and processing in a third level, each output of said plurality of second-level branches via a corresponding one of a plurality of third-level branches, wherein each of said plurality of third-level branches comprises a plurality of sub-branches, and each sub-branch; samples at a third sampling rate that is reduced compared to said second sampling rate; and applies analog-to-digital conversion (ADC). - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A system, comprising:
a radio frequency (RF) receiver implemented on a single chip, the RF receiver comprising; a first sampling module that is operable to sample in a first level, an input RF signal, at a particular main sampling rate; a plurality of second-level sampling modules, wherein each of said plurality of second-level sampling modules is operable to sample in a second level, an output of said first level, at a second sampling rate that is reduced compared to said main sampling rate; a plurality of third-level sampling modules, wherein; each of said plurality of third-level sampling modules is operable to samples in a third level, at a third sampling rate that is reduced compared to said second sampling rate; and said plurality of third-level sampling modules is configured into a plurality of sub-sets, each of said plurality of sub-sets corresponding to one of said plurality of second-level sampling modules; and a plurality of third-level analog-to-digital conversion (ADC) modules, wherein each of said ADC modulates is associated with a particular one of said plurality of third-level sampling modules. - View Dependent Claims (16, 17, 18, 19, 20)
Specification