APPARATUS AND METHOD FOR DETERMINING BATTERY/CELL'S PERFORMANCE, AGE, AND HEALTH

• US 20120310565A1
• Filed: 05/25/2012
• Published: 12/06/2012
• Est. Priority Date: 05/31/2011
• Status: Abandoned Application

• Current Assignee: Redey, Laszlo
• Original Assignee: Redey, Laszlo
• Inventors: Redey, Laszlo
• Application Number:
  US13/481,539
• Publication Number:
  US 20120310565A1
• Time in Patent Office: Days
• US Class Current: 702/63
• CPC Class Codes: G01R 31/367 Software therefor, e.g. for battery testing using modelling or look-up tables
• CPC Class Codes: G01R 31/378 specially adapted for the type of battery or accumulator
• CPC Class Codes: G01R 31/386 using test-loads
• CPC Class Codes: G01R 31/392 Determining battery ageing or deterioration, e.g. state of health

Abstract

A self-energized measuring system for determining primary and secondary battery/cell'"'"'s performance, age, and health by measuring and recording battery/cell'"'"'s voltage response to a specified load-changing perturbation spot-test event. The cell'"'"'s voltage response is compared to a synchronously measured voltage signal of a comparator resistor. The relationship between the two voltage signals is analyzed on logarithmic time scale to determine performance parameters such as cell impedance and power and their variation in the time domain. The cell temperature is also measured for impedance and power normalization for 20 centigrade. Results are compared to a previously generated master data tabulation characteristic of a similar, new cell of perfect health condition. The time-domain performance parameters are related to the performance, age and health of the cell at any particular instant. The evaluation method can be easily adjusted to various battery chemistries, types.

Claims

1. A method for generating data to evaluate quality of a galvanic cell to be tested,

wherein parameters of a good quality reference cell of the same type are generated by performing the following operations:

a) measuring temperature of said cell versus time;

b) measuring voltage of said cell in load-free condition;

c) applying a predetermined load current across a comparator resistor to the cell for a first predetermined period

d) measuring voltage of said cell versus time during said first predetermined period;

e) measuring voltage drop on said comparator resistor caused by load current flowing from said cell d versus time during said first predetermined period;

f) switching off said load after the expiry of said first predetermined period;

g) measuring voltage of the cell versus time for a second predetermined period after switching off said load

h) normalizing data obtained by said steps a) to g) to a predetermined temperature

i) setting up a look-up table MDT including said normalized data identifying the type of the said cell and measured data;

j) generating parameters of the cell to be tested by performing the same operations as defined in steps a) to h);

k) conveying data gained as defined in j) for comparing them to the data of said look-up table MDT.

2. The method as claimed in claim 1, wherein said look-up table MDT includes data gained along a logarithmic time-scale.

3. The method as claimed in claim 1, wherein steps a) to g) are carried out is a stabilized state of the cell.

4. The method as claimed in claim 1, wherein

c1) applying a predetermined charge current to said cell for a third predetermined period;

d1) measuring voltage of said cell versus time during said third predetermined period;

e1) measuring voltage drop on said comparator resistor caused by load current flowing from said cell versus time during said third predetermined period;

f1) switching off said load after the expiry of said third predetermined period;

g1) measuring voltage of the cell versus time for a fourth predetermined period after switching off said load

l) h1) normalizing data obtained by said steps a1) to g1) to a predetermined temperature

i1) completing said look-up table MDT by data gained as defined in c1) to h1);

j1) generating parameters of the cell to be tested by performing the same operations as defined in c1) to h1);

k1) conveying data gained as defined in j1) for comparing them to the data of said look-up table MDT.

8. Apparatus for carrying out the method according to claim 1 and for generating data to evaluate quality of a galvanic/cell to be tested, said apparatus including means for

a) measuring temperature of a cell versus time

b) measuring voltage of said cell;

c) applying a predetermined load current across a comparator resistor to the cell for a first predetermined period at a first time instant, said means including a switch;

d) measuring voltage of said cell versus time during said first predetermined period;

e) measuring voltage drop on said comparator resistor caused by load current flowing from said cell versus time during said first predetermined period

f) switching off said load after the expiry of said first predetermined period;

g) measuring voltage of the cell versus time for a second predetermined period after switching off said load;

h) conveying data gained as defined in h) for evaluation;

i) computing means adapted for normalizing said conveyed data to a predetermined temperature and for selecting values along a logarithmic time scale;

j) data storage for setting up a look-up table including data of a parameters of a good quality reference cell identifying the type of the said cell and measured data;

wherein said computing means is adapted to compare measured and normalized data of the cell to be tested with that of said reference cell previously stored in said look-up table

9. The apparatus as claimed in claim 8, further including means for

c1) applying a predetermined charge current across a comparator resistor to said cell for a third predetermined period;

d1) measuring voltage of said cell versus time during said third predetermined period;

e1) measuring voltage drop on said comparator resistor caused by load current flowing from said cell d versus time during said third predetermined period;

f1) switching off said load after the expiry of said first third predetermined period;

g1) measuring voltage of the cell versus time for a fourth predetermined period after switching off said load

10. The apparatus as claimed in claim 8, wherein said means for applying a predetermined load current across a comparator resistor to the cell for a first predetermined period at a first time instant includes a switch connected to at least one of an interface of a data-acquisition and data processing hardware;

and an manual operation from operator.

11. The apparatus as claimed in claim 8, wherein said comparator resistor comprises a section of a cable carrying said load current.

5. The method as claimed in claim'"'"', wherein said load defined in c) comprises at least two different loads.

6. The method claimed in claim'"'"', wherein said measurements effected during said predetermined periods are performed at sampling intervals not longer than 50 ms, preferably 25 ms, particularly not longer than 10 ms at the beginning of said predetermined periods.

7. The method as claimed in claim 6, wherein said sampling is effected according to a logarithmic time scale.