Method Of Mass Spectrometry
First Claim
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1. A method of analysis of data produced from the imaging of a substrate comprising the steps of:
- ionizing a sample of interest at multiple predetermined positions upon the sample,producing a mass spectrum of the ionized sample at each of said multiple predetermined positions using a Mass Analyser,creating an overall spectrum for the whole sample,selecting a number of peaks within the overall spectrum,creating a scan distribution for at least some of said selected peaks, andcomparing the scan distributions to identify correlations between different analytes within the sample.
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Abstract
This invention comprises a method of imaging of a substrate in which a sample of interest is first ionized at multiple known positions whereafter a mass spectrum of the ionized sample at each of the multiple known positions is produced using a Mass Spectrometer. An overall spectrum for the whole sample is then created, and a number of peaks within the overall spectrum is selected. A scan distribution for at least some of the selected peaks is created, and the scan distributions are compared to identify correlations between different analytes within the sample.
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16 Claims
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1. A method of analysis of data produced from the imaging of a substrate comprising the steps of:
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ionizing a sample of interest at multiple predetermined positions upon the sample, producing a mass spectrum of the ionized sample at each of said multiple predetermined positions using a Mass Analyser, creating an overall spectrum for the whole sample, selecting a number of peaks within the overall spectrum, creating a scan distribution for at least some of said selected peaks, and comparing the scan distributions to identify correlations between different analytes within the sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method of analysis of data produced from the imaging of a substrate substantially as hereinbefore described.
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