APPARATUS AND METHOD FOR DESIGNING SEMICONDUCTOR DEVICE, AND SEMICONDUCTOR DEVICE
First Claim
1. A method of designing a semiconductor device including a scan flip-flop circuit that can switch between scanning operation and capturing operation, the method causing an arithmetic processor to execute the steps of:
- analyzing a probability that an output value of the scan flip-flop circuit after the capturing operation becomes a given logical state; and
structuring a scan chain for a plurality of scan flip-flop circuits having the same degree of probability that the output value after the capturing operation becomes the given logical state, on the basis of a result of the analyzing step.
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Accused Products
Abstract
An arithmetic processor executes analysis processing for analyzing a probability that an output value of the scan flip-flop circuit after the capturing operation becomes a given logical state, and scan chain structure processing for structuring a scan chain for a plurality of scan flip-flop circuits having the same degree of probability that the output value after the capturing operation becomes the given logical state, on the basis of a result of the analyzing processing. The scan chain lower in a transition probability during the scan operation is formed so that a power consumption during a scan test can be reduced.
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Citations
13 Claims
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1. A method of designing a semiconductor device including a scan flip-flop circuit that can switch between scanning operation and capturing operation, the method causing an arithmetic processor to execute the steps of:
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analyzing a probability that an output value of the scan flip-flop circuit after the capturing operation becomes a given logical state; and structuring a scan chain for a plurality of scan flip-flop circuits having the same degree of probability that the output value after the capturing operation becomes the given logical state, on the basis of a result of the analyzing step. - View Dependent Claims (2, 3, 4, 5)
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6. A designing apparatus that can design a semiconductor device including a scan flip-flop circuit that can switch between scanning operation and capturing operation, the apparatus comprising:
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an arithmetic processor that can execute given processing according to a predetermined program, wherein the arithmetic processor executes; analysis processing for analyzing a probability that an output value of the scan flip-flop circuit after the capturing operation becomes a given logical state; and scan chain structure processing for structuring a scan chain for a plurality of scan flip-flop circuits having the same degree of probability that the output value after the capturing operation becomes the given logical state, on the basis of a result of the analysis processing. - View Dependent Claims (7, 8, 9)
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10. A semiconductor device comprising:
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a scan flip-flop circuit that can switch between scanning operation and capturing operation, wherein a scan chain is structured for a plurality of scan flip-flop circuits having the same degree of probability that an output value of the scan flip-flop circuit after the capturing operation becomes a given logical state. - View Dependent Claims (11, 12, 13)
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Specification