SEMICONDUCTOR INTERATED CIRCUIT
First Claim
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1. A semiconductor integrated circuit comprising:
- a first pad configured to receive a first voltage;
a second pad configured to receive a second voltage;
an internal voltage generation circuit configured to generate a third voltage having the same voltage level as the first voltage in response to the second voltage during a test mode; and
an internal circuit configured to perform a normal operation using the first voltage and the second voltage during a normal mode and perform a test operation using the second voltage and the third voltage during the test mode.
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Abstract
A semiconductor integrated circuit includes a first pad configured to receive a first voltage, a second pad configured to receive a second voltage, an internal voltage generation circuit configured to generate a third voltage having the same voltage level as the first voltage in response to the second voltage during a test mode, and an internal circuit configured to perform a normal operation using the first voltage and the second voltage during a normal mode and perform a test operation using the second voltage and the third voltage during the test mode.
8 Citations
13 Claims
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1. A semiconductor integrated circuit comprising:
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a first pad configured to receive a first voltage; a second pad configured to receive a second voltage; an internal voltage generation circuit configured to generate a third voltage having the same voltage level as the first voltage in response to the second voltage during a test mode; and an internal circuit configured to perform a normal operation using the first voltage and the second voltage during a normal mode and perform a test operation using the second voltage and the third voltage during the test mode. - View Dependent Claims (2, 3, 4)
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5. A semiconductor integrated circuit comprising:
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a first pad configured to receive a first voltage; a second pad configured to receive a second voltage having a higher voltage level than the first voltage; an internal voltage generation circuit configured to generate a third voltage in response to the second voltage, wherein the third voltage has a lower voltage level than the first voltage during a normal mode and the same voltage level as the first voltage during a test mode; and an internal circuit configured to perform a normal operation using the first voltage to the third voltage during the normal mode and perform a test operation using the second voltage and the third voltage during the test mode. - View Dependent Claims (6, 7, 8, 9, 10, 11)
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12. A semiconductor integrated circuit comprising:
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a first pad configured to receive a first voltage in a normal mod of the semiconductor integrated circuit; a second pad configured to receive a second voltage in the normal mode and a test mode of the semiconductor integrated circuit; and an internal voltage generation circuit configured to generate a third voltage in response to the second voltage, wherein the third voltage has a lower voltage level than the first voltage during the normal mode and the same voltage level as the first voltage during the test mode. - View Dependent Claims (13)
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Specification