OBJECT INSPECTION WITH REFERENCED VOLUMETRIC ANALYSIS SENSOR

• US 20130028478A1
• Filed: 05/03/2011
• Published: 01/31/2013
• Est. Priority Date: 05/04/2010
• Status: Abandoned Application

• Current Assignee: Creaform, Inc. (Ametek Incorporated)
• Original Assignee: Creaform, Inc. (Ametek Incorporated)
• Inventors: St-Pierre, ric, Hbert, Patrick, Mony, Charles
• Application Number:
  US13/639,359
• Publication Number:
  US 20130028478A1
• Time in Patent Office: Days
• US Class Current: 382/103
• CPC Class Codes: G01B 11/002 for measuring two or more coordinates
• CPC Class Codes: G01B 17/02 for measuring thickness

Abstract

A positioning method and system for non-destructive inspection of an object include providing at least one volumetric analysis sensor having sensor reference targets; providing a sensor model of a pattern of at least some of the sensor reference targets; providing object reference targets on at least one of the object and an environment of the object; providing an object model of a pattern of at least some of the object reference targets; providing a photogrammetric system including at least one camera and capturing at least one image in a field of view, at least a portion of the sensor reference and the object reference targets being apparent on the image; determining a sensor spatial relationship and an object spatial relationship; determining a sensor-to-object spatial relationship of the at I act one volumetric analysis sensor with respect to the object; repeating the steps and tracking a displacement of the volumetric analysis sensor and the object.

Claims

1. A positioning method for non-destructive inspection of an object, comprising:

providing at least one volumetric analysis sensor for said inspection, said volumetric analysis sensor having sensor reference targets;

providing a sensor model of a pattern of 3D positions of at least some of said sensor reference targets of said volumetric analysis sensor;

providing object reference targets on at least one of said object and an environment of said object;

providing an object model of a pattern of 3D positions of at least some of said object reference targets;

providing a photogrammetric system including at least one camera to capture at least one image in a field of view;

capturing an image in said field of view using said photogrammetric system, at least a portion of said sensor reference targets and said object reference targets being apparent on said image;

determining a sensor spatial relationship between the photogrammetric system and said sensor reference targets using said sensor model and said captured image;

determining an object spatial relationship between the photogrammetric system and said object reference targets using said object model and said captured image;

determining a sensor-to-object spatial relationship of said at least one volumetric analysis sensor with respect to said object using said object spatial relationship and said sensor spatial relationship;

repeating said capturing, said determining said sensor-to-object spatial relationship and at least one of said determining said sensor spatial relationship and said determining said object spatial relationship;

tracking a displacement of said at least one of said volumetric analysis sensor and said object using said sensor-to-object spatial relationship.

2. The positioning method as claimed in claim 1, further comprising providing inspection measurements about said object using said at least one volumetric analysis sensor;

and using at least one of said sensor spatial relationship, said object spatial relationship and said sensor-to-object spatial relationship to reference said inspection measurements and generate referenced inspection data in a common coordinate system.

3. The positioning method as claimed in claim 1, wherein at least one of said providing said object model and providing said sensor model includes building a respective one of said object and sensor model during said capturing said image using said photogrammetric system.

4. The positioning method as claimed in claim 1, further comprising:

providing an additional sensor tool;

obtaining sensor information using said additional sensor tool;

referencing said additional sensor tool with respect to said object.

5. The positioning method as claimed in claim 4, wherein said referencing said additional sensor tool with respect to said object includes using an independent positioning system for said additional sensor tool and using said object reference targets.

6. The positioning method as claimed in claim 4,

wherein said additional sensor tool has tool reference targets;

further comprising;

providing a tool model of a pattern of 3D positions of at least some of said tool reference targets of said additional sensor tool;

determining a tool spatial relationship between the photogrammetric system and said tool reference targets using said tool model;

determining a tool-to-object spatial relationship of said additional sensor tool with respect to said object using said tool spatial relationship and at least one of said sensor-to-object spatial relationship and said object spatial relationship;

repeating said capturing, said determining said tool spatial relationship and said determining said tool-to-object spatial relationship;

tracking a displacement of said additional sensor tool using said tool-to-object spatial relationship.

7. The positioning method as claimed in claim 2, further comprising building a model of an internal surface of said object using said inspection measurements obtained by said volumetric analysis sensor.

8. The positioning method as claimed in claim 2, wherein said inspection measurements are thickness data.

9. The positioning method as claimed in claim 2, further comprising

providing a CAD model of an external surface of said object;

using said CAD model and said sensor-to-object spatial relationship to align said inspection measurements obtained by said volumetric analysis sensor in said common coordinate system.

10. The positioning method as claimed in claim 4, further comprising

providing a CAD model of an external surface of said object;

acquiring information about features of said external surface of said object using said additional sensor tool;

using said CAD model, said information about features and said sensor-to-object spatial relationship to align said inspection measurements obtained by said volumetric analysis sensor in said common coordinate system.

11. A positioning system for non-destructive inspection of an object, comprising:

at least one volumetric analysis sensor for said inspection, said volumetric analysis sensor having sensor reference targets and being adapted to be displaced;

object reference targets provided on at least one of said object and an environment of said object;

a photogrammetric system including at least one camera to capture at least one image in a field of view, at least a portion of said sensor reference targets and said object reference targets being apparent on said image;

a position tracker for

obtaining a sensor model of a pattern of 3D positions of at least some of said sensor reference targets of said volumetric analysis sensor;

obtaining an object model of a pattern of 3D positions of at least some of said object reference targets;

determining an object spatial relationship between the photogrammetric system and said object reference targets using said object model pattern and said captured image;

determining a sensor spatial relationship between the photogrammetric system and said sensor reference targets using said sensor model and said captured image;

determining a sensor-to-object spatial relationship of said at least one volumetric analysis sensor with respect to said object using said object spatial relationship and said sensor spatial relationship;

tracking a displacement of said volumetric analysis sensor using sensor-to-object spatial relationship.

12. The positioning system as claimed in claim 11, wherein said volumetric analysis sensor provides inspection measurements about said object and wherein said position tracker is further for using at least one of said sensor spatial relationship, object spatial relationship and sensor-to-object spatial relationship to reference said inspection measurements and generate referenced inspection data.

13. The positioning system as claimed in claim 12, further comprising a model builder for building at least one of said sensor model and said object model using said photogrammetric system.

14. The positioning system as claimed in claim 11, further comprising an additional sensor tool for obtaining sensor information.

15. The positioning system as claimed in claim 14, wherein said additional sensor tool is adapted to be displaced and said additional sensor tool has tool reference targets and wherein said position tracker is further for tracking a displacement of said additional sensor tool using said photogrammetric system and a tool model of a pattern of tool reference targets on said additional sensor tool.