MOTHERBOARD ALARM SYSTEM TEST CIRCUIT

• US 20130030729A1
• Filed: 03/09/2012
• Published: 01/31/2013
• Est. Priority Date: 07/29/2011
• Status: Abandoned Application

• Current Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Original Assignee: Hong Fu Jin Precision Industry (Shenzhen) Co., Ltd. (Hon Hai Precision Industry Co., Ltd.), Hon Hai Precision Industry Co., Ltd.
• Inventors: TU, YI-XIN, ZHANG, GUO-FENG, PENG, ZHENG-QUAN, ZHOU, HAI-QING
• Application Number:
  US13/415,849
• Publication Number:
  US 20130030729A1
• Time in Patent Office: Days
• US Class Current: 702/58
• CPC Class Codes: G06F 11/2215 to test error correction or detection circuits

Abstract

A motherboard alarm system test circuit includes an infrared emitter, a memory, and a circuit board. The circuit board includes a memory slot, many edge connectors, an infrared receiver, a single chip computer, and a switch circuit. The memory slot includes many spaced metal sheets. One end of each metal sheet is electrically connected to one of the first golden fingers of the memory. Each edge connector is electrically connected to the other end of each metal sheet. The second golden fingers of the circuit board are electrically connected to the memory slot. The signal chip computer includes an input pin electrically connected to the infrared receiver. The switch circuit is electrically connected to the signal chip computer. The switch circuit controls an electrical connection between the plurality of metal sheets and the plurality of first golden fingers of the memory.

Claims

1. A motherboard alarm system test circuit for testing a memory alarm system of a motherboard comprising:

an infrared emitter for emitting a first infrared light,

a memory, the memory comprising a plurality of first golden fingers, and

a circuit board, comprising;

a memory slot, the memory slot comprising a plurality of spaced metal sheets, a first end of each of the metal sheets electrically connected to one of the first golden fingers of the memory;

a plurality of second golden fingers, each of the second golden fingers electrically connected to a second end of each of the metal sheets, the second golden fingers of the circuit board electrically connected to the memory slot of the motherboard;

an infrared receiver for receiving the first infrared light;

a single chip computer, the single chip computer comprising an input pin electrically connected to the infrared receiver; and

a switch circuit electrically connected to the signal chip computer, the switch circuit controlling an electrical connection between the plurality of metal sheets and the plurality of first golden fingers of the memory.

2. The motherboard alarm system test circuit of claim 1, wherein the signal chip computer further comprises a first output pin, the switch circuit comprises a first relay, the first relay comprises a first pin electrically connected to the first output pin, a third pin, and a fourth pin, the third pin of the first relay is electrically connected to one of the metal sheets of the circuit board, such that the third pin of the first relay is electrically connected to one of the first golden fingers of the memory, the fourth pin is grounded.

3. The motherboard alarm system test circuit of claim 2, wherein the first infrared light emitted is received by the infrared receiver, and a first electrical signal indicative of the infrared light is sent to the single chip computer via the input pin.

4. The motherboard alarm system test circuit of claim 3, wherein the single chip computer controls to output a high level signal at the first output pin according to the first electrical signal, such that the first pin of the first relay is set at a high level voltage, and the third pin of the first relay is electrically connected to the fourth pin of the first relay causing the metal sheet that is electrically connected to the third pin of the first relay to be grounded, and one of the first golden fingers of the memory to be grounded.

5. The motherboard alarm system test circuit of claim 4, wherein when one of the first golden fingers of the memory is grounded, the memory ceases working, if the memory alarm system alarm, the memory alarm system is in a normal state.

6. The motherboard alarm system test circuit of claim 4, wherein when one of the first golden fingers of the memory is grounded, the memory ceases working, if the memory alarm system does not alarm, the memory alarm system is in an abnormal state.

7. The motherboard alarm system test circuit of claim 4, wherein the signal chip computer further comprises a second output pin, the switch circuit further comprises a second relay, the second relay comprises a fifth pin electrically connected to the second output pin, a seventh pin, and a eighth pin, the seventh pin of the second relay is electrically connected to another individual metal sheet of the memory slot of the circuit board, such that the seventh pin of the second relay is electrically connected to the another individual golden finger of the memory, the eighth pin of the second relay is grounded.

8. The motherboard alarm system test circuit of claim 7, wherein when the emitter emits a second infrared light, the first infrared light emitted is received by the infrared receiver, and a second electrical signal indicative of the second infrared light is sent to the single chip computer.

9. The motherboard alarm system test circuit of claim 8, wherein the single chip computer controls to output a high level signal at the second output pin according to the second electrical signal, such that the fifth pin of the second relay is set at a high level voltage, and the seventh pin of the second relay is electrically connected to the eighth pin of the second relay causing the metal sheet that is electrically connected to the seventh pin of the second relay to be grounded, and one of the first golden fingers of the memory to be grounded.

10. The motherboard alarm system test circuit of claim 9, wherein when one of the first golden fingers of the memory is grounded, a fault occurs in the memory, if the memory alarm system alarm, the memory alarm system is in a normal state.

11. The motherboard alarm system test circuit of claim 9, wherein when one of the first golden fingers of the memory is grounded, a fault occurs in the memory, if the memory alarm system does not alarm, the memory alarm system is in an abnormal state.

12. The motherboard alarm system test circuit of claim 1, wherein the switch circuit further comprises a BJT electrically connected to the first relay, a base electrode of the BJT is electrically connected to the first output pin, a collector electrode of the BJT is electrically connected to a power source, and an emitter electrode of the BJT is electrically connected to the first pin of the first relay.