×

DYNAMIC PREDICTION OF RISK LEVELS FOR MANUFACTURING OPERATIONS THROUGH LEADING RISK INDICATORS

  • US 20130063264A1
  • Filed: 09/11/2012
  • Published: 03/14/2013
  • Est. Priority Date: 09/12/2011
  • Status: Active Grant
First Claim
Patent Images

1. A method for identifying a hidden process near-miss in a plant/facility operation, the method comprising:

  • collecting measured data associated with at least one process variable, although without related adverse incident;

    collecting long-term process data;

    determining normal values or value ranges, or combinations thereof, based on long-term process data, andcomparing the measured data associated with the at least one process variable with the collected long-term process data to determine deviation there between measured data relative to determined normal value(s), wherein a measure or extent, or both, of the deviation identifies at least one hidden process near-miss.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×