SENSOR AND A METHOD FOR CHARACTERISING A DIELECTRIC MATERIAL
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Abstract
The present disclosure provides a method of characterising a dielectric material. The method comprises the step of providing a light source, a light collector and a sensor. The sensor is arranged so that an evanescent field of light penetrates through a surface of the sensor and surface plasmons are generated at the surface of the sensor when suitable light is directed along at least a portion of the sensor. The method also includes the step of exposing the surface of the sensor to the dielectric material so that an interface is formed between the surface and the dielectric material. Further, the method comprises guiding light along at least a portion of the sensor to generate the surface plasmons. In addition, the method comprises the step of collecting an intensity of light from the interface as a function of a spectral parameter of the light. Further, the present disclosure provides an apparatus for characterising the dielectric material in accordance with the method.
15 Citations
40 Claims
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1-20. -20. (canceled)
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21. A method of characterising a dielectric material, the method comprising the steps of:
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providing a light source, a light collector and a sensor, the sensor being arranged so that an evanescent field of light penetrates a surface of the sensor and surface plasmons are generated at the surface of the sensor when suitable light is directed along at least a portion of the sensor; exposing the surface of the sensor to the dielectric material so that an interface is formed between the surface and the dielectric material; guiding light along at least a portion of the sensor to generate the surface plasmons; and collecting an intensity of light from the interface as a function of a spectral parameter of the light. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29)
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30. An apparatus for characterising a dielectric material, the apparatus comprising:
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at least one sensor having a sensing region and an optical waveguide for guiding light along the sensing region, the sensing region comprising a film having a structured surface for forming an interface with the dielectric material, the sensor being arranged such that the evanescent field of the light penetrates through at least a portion of the interface such that surface plasmons are generated at that interface when suitable light is directed though or adjacent the sensing region; a light source; and at least one collector for collecting an intensity of light from the interface as a function a spectral parameter of the light. - View Dependent Claims (31, 32, 33)
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34. A method of characterising a dielectric material, the dielectric material, the method comprising the steps of:
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generating surface plasmons by an evanescent field of light that penetrates an interface formed between a surface of a sensor and the dielectric material; collecting a first intensity of light as a function of a spectral parameter of the light, the first intensity of light being indicative of an intensity of the generated surface plasmons; and collecting a second intensity of light as a function of a spectral parameter of the light, the second intensity of light being indicative of a property of the dielectric material. - View Dependent Claims (35, 36, 37, 38, 39)
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40. An apparatus for characterising a dielectric material, the apparatus comprising:
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at least one sensor having a sensing region and being arranged for directing suitable light though or adjacent the sensing region, the sensing region having a surface for forming an interface with the dielectric material, the sensor being arranged such that an evanescent field of the light penetrates through at least a portion of the interface whereby surface plasmons are generated at that interface; a light source; and at least one collector for collecting first and second intensities of light as a function of a spectral parameter of the light, the first intensity of light being indicative of an intensity of the generated surface plasmons and the second intensity of light being associated with a property or of the dielectric material.
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Specification