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Semiconductor Device and Method of Forming Interconnect Substration for FO-WLCSP

  • US 20130075936A1
  • Filed: 09/23/2011
  • Published: 03/28/2013
  • Est. Priority Date: 09/23/2011
  • Status: Active Grant
First Claim
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1. A method of making a semiconductor device, comprising:

  • providing a first carrier;

    depositing a first encapsulant over the first carrier;

    forming a plurality of conductive vias through the first encapsulant to form an interconnect substrate;

    providing a second carrier;

    mounting first and second semiconductor die over the second carrier;

    mounting the interconnect substrate over the second carrier adjacent to the first and second semiconductor die;

    depositing a second encapsulant over the first and second semiconductor die, interconnect substrate, and second carrier;

    forming a first interconnect structure over a first surface of the second encapsulant and electrically connected to the conductive vias of the interconnect substrate;

    removing the second carrier; and

    forming a second interconnect structure over a second surface of the second encapsulant opposite the first surface of the second encapsulant and electrically connected to the conductive vias of the interconnect substrate.

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