Semiconductor Device and Method of Forming Interconnect Substration for FO-WLCSP
First Claim
1. A method of making a semiconductor device, comprising:
- providing a first carrier;
depositing a first encapsulant over the first carrier;
forming a plurality of conductive vias through the first encapsulant to form an interconnect substrate;
providing a second carrier;
mounting first and second semiconductor die over the second carrier;
mounting the interconnect substrate over the second carrier adjacent to the first and second semiconductor die;
depositing a second encapsulant over the first and second semiconductor die, interconnect substrate, and second carrier;
forming a first interconnect structure over a first surface of the second encapsulant and electrically connected to the conductive vias of the interconnect substrate;
removing the second carrier; and
forming a second interconnect structure over a second surface of the second encapsulant opposite the first surface of the second encapsulant and electrically connected to the conductive vias of the interconnect substrate.
6 Assignments
0 Petitions
Accused Products
Abstract
A semiconductor device has a first encapsulant deposited over a first carrier. A plurality of conductive vias is formed through the first encapsulant to provide an interconnect substrate. A first semiconductor die is mounted over a second carrier. The interconnect substrate is mounted over the second carrier adjacent to the first semiconductor die. A second semiconductor die is mounted over the second carrier adjacent to the interconnect substrate. A second encapsulant is deposited over the first and second semiconductor die, interconnect substrate, and second carrier. A first interconnect structure is formed over a first surface of the second encapsulant and electrically connected to the conductive vias. A second interconnect structure is formed over a second surface of the second encapsulant and electrically connected to the conductive vias to make the Fo-WLCSP stackable. Additional semiconductor die can be mounted over the first and second semiconductor die in a PoP arrangement.
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Citations
25 Claims
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1. A method of making a semiconductor device, comprising:
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providing a first carrier; depositing a first encapsulant over the first carrier; forming a plurality of conductive vias through the first encapsulant to form an interconnect substrate; providing a second carrier; mounting first and second semiconductor die over the second carrier; mounting the interconnect substrate over the second carrier adjacent to the first and second semiconductor die; depositing a second encapsulant over the first and second semiconductor die, interconnect substrate, and second carrier; forming a first interconnect structure over a first surface of the second encapsulant and electrically connected to the conductive vias of the interconnect substrate; removing the second carrier; and forming a second interconnect structure over a second surface of the second encapsulant opposite the first surface of the second encapsulant and electrically connected to the conductive vias of the interconnect substrate. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A method of making a semiconductor device, comprising:
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forming an interconnect substrate having a plurality of conductive structures extending through the interconnect substrate; providing a first carrier; mounting the interconnect substrate over the first carrier; mounting a plurality of first semiconductor die over the first carrier adjacent to the interconnect substrate; depositing a first encapsulant over the first semiconductor die, interconnect substrate, and first carrier; and forming a first interconnect structure over a first surface of the first encapsulant and electrically connected to the conductive structures of the interconnect substrate. - View Dependent Claims (8, 9, 10, 11, 12, 13)
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14. A method of making a semiconductor device, comprising:
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forming an interconnect substrate having a plurality of conductive structures; disposing a first semiconductor die adjacent to the interconnect structure; depositing a first encapsulant over the first semiconductor die and interconnect substrate; and forming a first interconnect structure over a first surface of the first encapsulant and electrically connected to the conductive structures of the interconnect substrate. - View Dependent Claims (15, 16, 17, 18, 19, 20)
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21. A semiconductor device, comprising:
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an interconnect substrate having a plurality of conductive structures; a first semiconductor die disposed adjacent to the interconnect structure; an encapsulant deposited over the first semiconductor die and interconnect substrate; and a first interconnect structure formed over a first surface of the encapsulant and electrically connected to the conductive structures of the interconnect substrate. - View Dependent Claims (22, 23, 24, 25)
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Specification