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INTEGRATED CIRCUIT DEVICE TIMING CALIBRATION

  • US 20130076425A1
  • Filed: 03/21/2011
  • Published: 03/28/2013
  • Est. Priority Date: 06/08/2010
  • Status: Abandoned Application
First Claim
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1. A method of operation of an integrated circuit device, the method comprising:

  • transmitting, from a first integrated circuit device, a first calibration pattern having differently delayed rising edge transitions with respect to a timing reference;

    transmitting, from the first integrated circuit device, a second calibration pattern having differently delayed falling edge transitions with respect to the timing reference; and

    generating a timing offset for transmitting data from the first integrated circuit device, wherein the timing offset is derived from information received from a second integrated circuit device sampling the differently-delayed rising edge transitions of the first calibration pattern and the differently-delayed falling edge transitions of the second calibration pattern.

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