IMPLEMENTING AND CHECKING ELECTRONIC CIRCUITS WITH FLEXIBLE RAMPTIME LIMITS AND TOOLS FOR PERFORMING THE SAME
First Claim
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1. A method of manufacturing an electronic circuit, comprising:
- physically synthesizing a logical representation of an electronic circuit employing flexible ramptime limits;
performing a timing test on said physically synthesized electronic circuit employing said flexible ramptime limits and a processor; and
determining if there is a violation of said flexible ramptime limits.
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Abstract
A method of manufacturing an electronic circuit employing a flexible ramptime limit and an electronic circuit are disclosed. In one embodiment, the method includes: (1) physically synthesizing a logical representation of an electronic circuit employing flexible ramptime limits, (2) performing a timing test on the physically synthesized electronic circuit employing the flexible ramptime limits and a processor and (3) determining if there is a violation of the flexible ramptime limits.
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Citations
15 Claims
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1. A method of manufacturing an electronic circuit, comprising:
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physically synthesizing a logical representation of an electronic circuit employing flexible ramptime limits; performing a timing test on said physically synthesized electronic circuit employing said flexible ramptime limits and a processor; and determining if there is a violation of said flexible ramptime limits. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. An electronic circuit manufactured according to a method comprising:
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physically synthesizing a logical representation of said electronic circuit employing flexible ramptime limits; performing a timing test on said physically synthesized electronic circuit employing said flexible ramptime limits and a processor; and determining if there is a violation of said flexible ramptime limits.
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Specification